RD53A chip susceptibility to electromagnetic conducted noise

The RD53A read-out chip (65 nm CMOS) is a large-scale demonstrator for ATLAS and CMS phase 2 pixel upgrades. It is one of the key elements of the serial powering scheme for the next generation of pixel detectors. The susceptibility of the RD53A chip with respect to external EM noise has an impact on...

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Detalles Bibliográficos
Autores principales: Pradas, Alvaro, Arteche, Fernando, Esteban, Cristina, Arcega, Francisco Javier, Jiménez, Esther, Koukola, Dominik, Orfanelli, Stella, Christiansen, Jorgen
Lenguaje:eng
Publicado: SISSA 2020
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.22323/1.370.0064
http://cds.cern.ch/record/2724960
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author Pradas, Alvaro
Arteche, Fernando
Esteban, Cristina
Arcega, Francisco Javier
Jiménez, Esther
Koukola, Dominik
Orfanelli, Stella
Christiansen, Jorgen
author_facet Pradas, Alvaro
Arteche, Fernando
Esteban, Cristina
Arcega, Francisco Javier
Jiménez, Esther
Koukola, Dominik
Orfanelli, Stella
Christiansen, Jorgen
author_sort Pradas, Alvaro
collection CERN
description The RD53A read-out chip (65 nm CMOS) is a large-scale demonstrator for ATLAS and CMS phase 2 pixel upgrades. It is one of the key elements of the serial powering scheme for the next generation of pixel detectors. The susceptibility of the RD53A chip with respect to external EM noise has an impact on the integration strategies (grounding and shielding schemes) and operating conditions of future Pixel detectors. This paper presents a detailed analysis of the RD53A chip susceptibility to RF conducted disturbances in order to understand and address noise issues of RD53A Chip before the pixel upgrade installation.
id oai-inspirehep.net-1792928
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2020
publisher SISSA
record_format invenio
spelling oai-inspirehep.net-17929282020-07-25T21:16:00Zdoi:10.22323/1.370.0064http://cds.cern.ch/record/2724960engPradas, AlvaroArteche, FernandoEsteban, CristinaArcega, Francisco JavierJiménez, EstherKoukola, DominikOrfanelli, StellaChristiansen, JorgenRD53A chip susceptibility to electromagnetic conducted noiseDetectors and Experimental TechniquesThe RD53A read-out chip (65 nm CMOS) is a large-scale demonstrator for ATLAS and CMS phase 2 pixel upgrades. It is one of the key elements of the serial powering scheme for the next generation of pixel detectors. The susceptibility of the RD53A chip with respect to external EM noise has an impact on the integration strategies (grounding and shielding schemes) and operating conditions of future Pixel detectors. This paper presents a detailed analysis of the RD53A chip susceptibility to RF conducted disturbances in order to understand and address noise issues of RD53A Chip before the pixel upgrade installation.SISSAoai:inspirehep.net:17929282020
spellingShingle Detectors and Experimental Techniques
Pradas, Alvaro
Arteche, Fernando
Esteban, Cristina
Arcega, Francisco Javier
Jiménez, Esther
Koukola, Dominik
Orfanelli, Stella
Christiansen, Jorgen
RD53A chip susceptibility to electromagnetic conducted noise
title RD53A chip susceptibility to electromagnetic conducted noise
title_full RD53A chip susceptibility to electromagnetic conducted noise
title_fullStr RD53A chip susceptibility to electromagnetic conducted noise
title_full_unstemmed RD53A chip susceptibility to electromagnetic conducted noise
title_short RD53A chip susceptibility to electromagnetic conducted noise
title_sort rd53a chip susceptibility to electromagnetic conducted noise
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.22323/1.370.0064
http://cds.cern.ch/record/2724960
work_keys_str_mv AT pradasalvaro rd53achipsusceptibilitytoelectromagneticconductednoise
AT artechefernando rd53achipsusceptibilitytoelectromagneticconductednoise
AT estebancristina rd53achipsusceptibilitytoelectromagneticconductednoise
AT arcegafranciscojavier rd53achipsusceptibilitytoelectromagneticconductednoise
AT jimenezesther rd53achipsusceptibilitytoelectromagneticconductednoise
AT koukoladominik rd53achipsusceptibilitytoelectromagneticconductednoise
AT orfanellistella rd53achipsusceptibilitytoelectromagneticconductednoise
AT christiansenjorgen rd53achipsusceptibilitytoelectromagneticconductednoise

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