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Edge-TCT Characterisation on TowerJazz CMOS Sensor for the ITK Phase II Upgrade

The upcoming Phase II upgrade of the Large Hadron Collider (LHC) for the High Luminosity LHC requires the characterisation of new pixel sensors intended to be installed within the ATLAS experiment's inner tracker by 2024. The Edge Transient Current Technique is used to probe prototype TowerJazz...

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Detalles Bibliográficos
Autores principales: Sharma, Abhishek, Solans Sanchez, Carlos, Bortoletto, Daniela
Lenguaje:eng
Publicado: SISSA 2018
Materias:
Acceso en línea:https://dx.doi.org/10.22323/1.309.0055
http://cds.cern.ch/record/2743161
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author Sharma, Abhishek
Solans Sanchez, Carlos
Bortoletto, Daniela
author_facet Sharma, Abhishek
Solans Sanchez, Carlos
Bortoletto, Daniela
author_sort Sharma, Abhishek
collection CERN
description The upcoming Phase II upgrade of the Large Hadron Collider (LHC) for the High Luminosity LHC requires the characterisation of new pixel sensors intended to be installed within the ATLAS experiment's inner tracker by 2024. The Edge Transient Current Technique is used to probe prototype TowerJazz Investigator I test structures to study their radiation hardness performance including depletion levels and charge sharing.
id oai-inspirehep.net-1810835
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
publisher SISSA
record_format invenio
spelling oai-inspirehep.net-18108352020-10-31T19:42:18Zdoi:10.22323/1.309.0055http://cds.cern.ch/record/2743161engSharma, AbhishekSolans Sanchez, CarlosBortoletto, DanielaEdge-TCT Characterisation on TowerJazz CMOS Sensor for the ITK Phase II UpgradeDetectors and Experimental TechniquesThe upcoming Phase II upgrade of the Large Hadron Collider (LHC) for the High Luminosity LHC requires the characterisation of new pixel sensors intended to be installed within the ATLAS experiment's inner tracker by 2024. The Edge Transient Current Technique is used to probe prototype TowerJazz Investigator I test structures to study their radiation hardness performance including depletion levels and charge sharing.SISSAoai:inspirehep.net:18108352018
spellingShingle Detectors and Experimental Techniques
Sharma, Abhishek
Solans Sanchez, Carlos
Bortoletto, Daniela
Edge-TCT Characterisation on TowerJazz CMOS Sensor for the ITK Phase II Upgrade
title Edge-TCT Characterisation on TowerJazz CMOS Sensor for the ITK Phase II Upgrade
title_full Edge-TCT Characterisation on TowerJazz CMOS Sensor for the ITK Phase II Upgrade
title_fullStr Edge-TCT Characterisation on TowerJazz CMOS Sensor for the ITK Phase II Upgrade
title_full_unstemmed Edge-TCT Characterisation on TowerJazz CMOS Sensor for the ITK Phase II Upgrade
title_short Edge-TCT Characterisation on TowerJazz CMOS Sensor for the ITK Phase II Upgrade
title_sort edge-tct characterisation on towerjazz cmos sensor for the itk phase ii upgrade
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.22323/1.309.0055
http://cds.cern.ch/record/2743161
work_keys_str_mv AT sharmaabhishek edgetctcharacterisationontowerjazzcmossensorfortheitkphaseiiupgrade
AT solanssanchezcarlos edgetctcharacterisationontowerjazzcmossensorfortheitkphaseiiupgrade
AT bortolettodaniela edgetctcharacterisationontowerjazzcmossensorfortheitkphaseiiupgrade