New method for estimating detector efficiency for charged particles with Diamond Light Source

Detector prototypes are commonly characterised in testbeams, either using charged particles or X-rays. Charged particles are used to quantify detector performance in terms of absolute efficiency, while X-rays can provide additional information about the detector structure. This paper presents an alt...

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Autores principales: Metodiev, K, Mironova, M, Bortoletto, D, Plackett, R, Allport, P, Tortajada, I Asensi, Cardella, R, Dachs, F, Dao, V, Dyndal, M, de Acedo, L Flores Sanz, Freeman, P, Gabrielli, A, Gonella, L, Munker, M, Pernegger, H, Piro, F, Riedler, P, Sharma, A, Schioppa, E J, Shipsey, I, Snoeys, W, Sanchez, C Solans, Wennloef, H, Weatherill, D P, Wood, D, Worm, S
Lenguaje:eng
Publicado: 2020
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2020.164573
http://cds.cern.ch/record/2737315
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author Metodiev, K
Mironova, M
Bortoletto, D
Plackett, R
Allport, P
Tortajada, I Asensi
Cardella, R
Dachs, F
Dao, V
Dyndal, M
de Acedo, L Flores Sanz
Freeman, P
Gabrielli, A
Gonella, L
Munker, M
Pernegger, H
Piro, F
Riedler, P
Sharma, A
Schioppa, E J
Shipsey, I
Snoeys, W
Sanchez, C Solans
Wennloef, H
Weatherill, D P
Wood, D
Worm, S
author_facet Metodiev, K
Mironova, M
Bortoletto, D
Plackett, R
Allport, P
Tortajada, I Asensi
Cardella, R
Dachs, F
Dao, V
Dyndal, M
de Acedo, L Flores Sanz
Freeman, P
Gabrielli, A
Gonella, L
Munker, M
Pernegger, H
Piro, F
Riedler, P
Sharma, A
Schioppa, E J
Shipsey, I
Snoeys, W
Sanchez, C Solans
Wennloef, H
Weatherill, D P
Wood, D
Worm, S
author_sort Metodiev, K
collection CERN
description Detector prototypes are commonly characterised in testbeams, either using charged particles or X-rays. Charged particles are used to quantify detector performance in terms of absolute efficiency, while X-rays can provide additional information about the detector structure. This paper presents an alternative approach to calculating charged particle efficiencies, using the results of an X-ray testbeam of the mini-MALTA CMOS prototype at Diamond Light Source, and additional laboratory measurements. Results are presented for an unirradiated and an irradiated sample and compared to the results of charged particle testbeams at SPS and ELSA. The extrapolated efficiencies are in agreement with the measured values. Additionally, the extrapolated efficiency maps provide more insight about the location of the pixel inefficiencies, due to the better spatial resolution of the X-ray testbeam.
id oai-inspirehep.net-1815604
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2020
record_format invenio
spelling oai-inspirehep.net-18156042020-10-01T18:55:27Zdoi:10.1016/j.nima.2020.164573http://cds.cern.ch/record/2737315engMetodiev, KMironova, MBortoletto, DPlackett, RAllport, PTortajada, I AsensiCardella, RDachs, FDao, VDyndal, Mde Acedo, L Flores SanzFreeman, PGabrielli, AGonella, LMunker, MPernegger, HPiro, FRiedler, PSharma, ASchioppa, E JShipsey, ISnoeys, WSanchez, C SolansWennloef, HWeatherill, D PWood, DWorm, SNew method for estimating detector efficiency for charged particles with Diamond Light SourceDetectors and Experimental TechniquesDetector prototypes are commonly characterised in testbeams, either using charged particles or X-rays. Charged particles are used to quantify detector performance in terms of absolute efficiency, while X-rays can provide additional information about the detector structure. This paper presents an alternative approach to calculating charged particle efficiencies, using the results of an X-ray testbeam of the mini-MALTA CMOS prototype at Diamond Light Source, and additional laboratory measurements. Results are presented for an unirradiated and an irradiated sample and compared to the results of charged particle testbeams at SPS and ELSA. The extrapolated efficiencies are in agreement with the measured values. Additionally, the extrapolated efficiency maps provide more insight about the location of the pixel inefficiencies, due to the better spatial resolution of the X-ray testbeam.oai:inspirehep.net:18156042020
spellingShingle Detectors and Experimental Techniques
Metodiev, K
Mironova, M
Bortoletto, D
Plackett, R
Allport, P
Tortajada, I Asensi
Cardella, R
Dachs, F
Dao, V
Dyndal, M
de Acedo, L Flores Sanz
Freeman, P
Gabrielli, A
Gonella, L
Munker, M
Pernegger, H
Piro, F
Riedler, P
Sharma, A
Schioppa, E J
Shipsey, I
Snoeys, W
Sanchez, C Solans
Wennloef, H
Weatherill, D P
Wood, D
Worm, S
New method for estimating detector efficiency for charged particles with Diamond Light Source
title New method for estimating detector efficiency for charged particles with Diamond Light Source
title_full New method for estimating detector efficiency for charged particles with Diamond Light Source
title_fullStr New method for estimating detector efficiency for charged particles with Diamond Light Source
title_full_unstemmed New method for estimating detector efficiency for charged particles with Diamond Light Source
title_short New method for estimating detector efficiency for charged particles with Diamond Light Source
title_sort new method for estimating detector efficiency for charged particles with diamond light source
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2020.164573
http://cds.cern.ch/record/2737315
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