Direct Digitization and ADC Parameter Trade-off for Bunch-by-Bunch Signal Processing

With the technology improvements of analog-to-digital converters in terms of sampling rate and achievable resolution, direct digitization of beam signals is of growing interest in the field of beam diagnostics. The selection of a state-of-the-art analog-to-digital converter for such a task imposes a trade-off between sampling frequency and resolution. Understanding the dependency of the system performance on these features is fundamental. This paper presents an analysis and design methodology for such architectures. Analytical tools are used to guide the designer and to estimate the system performance as a function of the analog-to-digital converter performance. These estimations are then validated by Monte-Carlo simulations. As an example of this methodology an analysis for the next-generation electronics of the Large Hadron Collider beam position monitoring system is presented. The analytical model and the results obtained are discussed, along with comparisons to beam measurements obtained at the Large Hadron Collider.