Cargando…
Direct Digitization and ADC Parameter Trade-off for Bunch-by-Bunch Signal Processing
With the technology improvements of analog-to-digital converters in terms of sampling rate and achievable resolution, direct digitization of beam signals is of growing interest in the field of beam diagnostics. The selection of a state-of-the-art analog-to-digital converter for such a task imposes a...
| Autores principales: | , , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
2020
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.18429/JACoW-IBIC2020-FRAO02 http://cds.cern.ch/record/2772587 |