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Study of the Deposited Energy Spectra in Silicon by High-Energy Neutron and Mixed Fields
The energy deposition spectra in a silicon detector have been measured at chip irradiation (ChipIr) and Cern High energy AcceleRator Mixed field (CHARM) facilities. The measurement was possible thanks to a fast electronic chain that can cope with high instantaneous fluxes. A computational study of t...
| Autores principales: | , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2020
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/tns.2019.2944657 http://cds.cern.ch/record/2759058 |