Cargando…
Stochastic Characterization of Voltage Sag Occurrence Based on Field Data
Computational methods for predicting voltage sags consider their occurrence as a Poisson process, although without confirmation from monitoring data, until now. In this paper, the stochastic nature of voltage sags is analyzed and discussed using monitoring data from 60 sites of the Portuguese Transm...
Autores principales: | , , |
---|---|
Lenguaje: | eng |
Publicado: |
2019
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.1109/tpwrd.2018.2878997 http://cds.cern.ch/record/2759062 |
_version_ | 1780970300408594432 |
---|---|
author | Santos, Andre dos Rosa, Tiago Correia de Barros, Maria Teresa |
author_facet | Santos, Andre dos Rosa, Tiago Correia de Barros, Maria Teresa |
author_sort | Santos, Andre dos |
collection | CERN |
description | Computational methods for predicting voltage sags
consider their occurrence as a Poisson process, although without
confirmation from monitoring data, until now. In this paper, the
stochastic nature of voltage sags is analyzed and discussed using
monitoring data from 60 sites of the Portuguese Transmission Network, covering the years 2011–2015 (a total of 17 157 recorded
voltage sags). A mathematical model to describe the voltage sag
occurrence as a stochastic process is presented. The assumption
of constant failure rates of the network elements implies that the
occurrence of voltage sags is a Poisson process. However, that assumption is not valid if voltage sag clusters are included, as these
imply considering time-dependent failure rates. Then, the time between voltage sags is described by an exponential distribution, if
clusters are not included, and may be described by the gamma distribution, if including clusters. The boundaries of the adequacy of
exponential and gamma distributions are assessed, based on monitoring data. The time of occurrence of monitored voltage sags are
analyzed and results confirm that the Poisson process describes
the occurrence of voltage sags when voltage sag clusters are disregarded. The gamma distribution fitting is also confirmed when
clusters are included in the analysis. |
id | oai-inspirehep.net-1852106 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2019 |
record_format | invenio |
spelling | oai-inspirehep.net-18521062021-05-11T13:18:28Zdoi:10.1109/tpwrd.2018.2878997http://cds.cern.ch/record/2759062engSantos, Andre dosRosa, TiagoCorreia de Barros, Maria TeresaStochastic Characterization of Voltage Sag Occurrence Based on Field DataDetectors and Experimental TechniquesComputational methods for predicting voltage sags consider their occurrence as a Poisson process, although without confirmation from monitoring data, until now. In this paper, the stochastic nature of voltage sags is analyzed and discussed using monitoring data from 60 sites of the Portuguese Transmission Network, covering the years 2011–2015 (a total of 17 157 recorded voltage sags). A mathematical model to describe the voltage sag occurrence as a stochastic process is presented. The assumption of constant failure rates of the network elements implies that the occurrence of voltage sags is a Poisson process. However, that assumption is not valid if voltage sag clusters are included, as these imply considering time-dependent failure rates. Then, the time between voltage sags is described by an exponential distribution, if clusters are not included, and may be described by the gamma distribution, if including clusters. The boundaries of the adequacy of exponential and gamma distributions are assessed, based on monitoring data. The time of occurrence of monitored voltage sags are analyzed and results confirm that the Poisson process describes the occurrence of voltage sags when voltage sag clusters are disregarded. The gamma distribution fitting is also confirmed when clusters are included in the analysis.oai:inspirehep.net:18521062019 |
spellingShingle | Detectors and Experimental Techniques Santos, Andre dos Rosa, Tiago Correia de Barros, Maria Teresa Stochastic Characterization of Voltage Sag Occurrence Based on Field Data |
title | Stochastic Characterization of Voltage Sag Occurrence Based on Field Data |
title_full | Stochastic Characterization of Voltage Sag Occurrence Based on Field Data |
title_fullStr | Stochastic Characterization of Voltage Sag Occurrence Based on Field Data |
title_full_unstemmed | Stochastic Characterization of Voltage Sag Occurrence Based on Field Data |
title_short | Stochastic Characterization of Voltage Sag Occurrence Based on Field Data |
title_sort | stochastic characterization of voltage sag occurrence based on field data |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.1109/tpwrd.2018.2878997 http://cds.cern.ch/record/2759062 |
work_keys_str_mv | AT santosandredos stochasticcharacterizationofvoltagesagoccurrencebasedonfielddata AT rosatiago stochasticcharacterizationofvoltagesagoccurrencebasedonfielddata AT correiadebarrosmariateresa stochasticcharacterizationofvoltagesagoccurrencebasedonfielddata |