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Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics
The application of CVD diamonds as radiation-hard particle detectors with outstanding properties for heavy ion beamline diagnostics is presented. Synchrotron particle spills ranging from a single ion to well beyond $10^8$ pps can be analyzed while maintaining single-particle time resolution below f...
Autores principales: | , , , , , |
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Lenguaje: | eng |
Publicado: |
1998
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1063/1.57055 http://cds.cern.ch/record/2633866 |
_version_ | 1780959731359154176 |
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author | Moritz, P Berdermann, E Blasche, K Rodl, H Stelzer, H Zeytouni, F |
author_facet | Moritz, P Berdermann, E Blasche, K Rodl, H Stelzer, H Zeytouni, F |
author_sort | Moritz, P |
collection | CERN |
description | The application of CVD diamonds as radiation-hard particle detectors with outstanding properties for heavy ion beamline diagnostics is presented. Synchrotron particle spills ranging from a single ion to well beyond $10^8$ pps can be analyzed while maintaining single-particle time resolution below fractions of a nanosecond. With segmented electrode structures on the diamond surface, higher particle count rates and improved monitoring of x/y beam profiles can be achieved. Diamond detectors with areas up to $30 \times 30$ mm$^2$ for a precise measurement system for beam intensity, beam profiles, and spill time-structure are described. |
id | oai-inspirehep.net-484764 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1998 |
record_format | invenio |
spelling | oai-inspirehep.net-4847642019-09-30T06:29:59Zdoi:10.1063/1.57055http://cds.cern.ch/record/2633866engMoritz, PBerdermann, EBlasche, KRodl, HStelzer, HZeytouni, FDiamond detectors with subnanosecond time resolution for heavy ion spill diagnosticsAccelerators and Storage RingsThe application of CVD diamonds as radiation-hard particle detectors with outstanding properties for heavy ion beamline diagnostics is presented. Synchrotron particle spills ranging from a single ion to well beyond $10^8$ pps can be analyzed while maintaining single-particle time resolution below fractions of a nanosecond. With segmented electrode structures on the diamond surface, higher particle count rates and improved monitoring of x/y beam profiles can be achieved. Diamond detectors with areas up to $30 \times 30$ mm$^2$ for a precise measurement system for beam intensity, beam profiles, and spill time-structure are described.oai:inspirehep.net:4847641998 |
spellingShingle | Accelerators and Storage Rings Moritz, P Berdermann, E Blasche, K Rodl, H Stelzer, H Zeytouni, F Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics |
title | Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics |
title_full | Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics |
title_fullStr | Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics |
title_full_unstemmed | Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics |
title_short | Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics |
title_sort | diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics |
topic | Accelerators and Storage Rings |
url | https://dx.doi.org/10.1063/1.57055 http://cds.cern.ch/record/2633866 |
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