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First results on charge collection efficiency of heavily irradiated microstrip sensors fabricated on oxygenated p-type silicon

Heavy hadron irradiation leads to type inversion of n-type silicon detectors. After type inversion, the charge collected at low bias voltages by silicon microstrip detectors is higher when read out from the n-side compared to p-side read out. The n-side read out has been successfully used in combina...

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Detalles Bibliográficos
Autores principales: Casse, G, Allport, P P, Martí i Garcia, S, Lozano, M, Turner, P R
Lenguaje:eng
Publicado: 2004
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2003.11.015
http://cds.cern.ch/record/2635927