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Prediction of charge collection efficiency in hadron-irradiated pad and pixel silicon detectors
The Transient Current Technique (TCT) is used to measure pulse shapes of charge collection and to derive trapping times in irradiated silicon pad detectors in a fluence range up to $10^{15} \ n_{\rm{eq}} \rm{cm}^{-2}$. Simulations of electrical fields and charge collection mechanisms compared to the...
| Autores principales: | , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2006
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2006.05.273 http://cds.cern.ch/record/2635133 |