TCT and test beam results of irradiated magnetic Czochralski silicon (MCz-Si) detectors

Pad and strip detectors processed on high resistivity n-type magnetic Czochralski silicon (MCz-Si) were irradiated to several different fluences with protons. The pad detectors were characterized with the transient current technique (TCT) and the full-size strip detectors with a reference beam teles...

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Detalles Bibliográficos
Autores principales: Luukka, P, Härkönen, J, Mäenpää, T, Betchart, B, Czellar, S, Demina, R, Furgeri, A, Gotra, Y, Frey, M, Hartmann, F, Korjenevski, S, Kortelainen, M J, Lampén, T, Ledermann, B, Lemaitre, V, Liamsuwan, T, Militaru, O, Moilanen, H, Simonis, H J, Spiegel, L, Tuominen, E, Tuominiemi, J, Tuovinen, E
Lenguaje:eng
Publicado: 2009
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2009.01.071
http://cds.cern.ch/record/2634862

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