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Effect of Fractal Topology on the Resistivity Response of Thin Film Sensors

We discuss the effect of topological inhomogeneity of very thin metallic conductometric sensors on their response to external stimuli, such as pressure, intercalation, or gas absorption, that modify the material’s bulk conductivity. The classical percolation model was extended to the case in which s...

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Detalles Bibliográficos
Autores principales: Kopnov, Gregory, Das, Sudhansu Sekhar, Gerber, Alexander
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10007381/
https://www.ncbi.nlm.nih.gov/pubmed/36904619
http://dx.doi.org/10.3390/s23052409

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