Probing the Cr(3+) luminescence sensitization in β-Ga(2)O(3) with ion-beam-induced luminescence and thermoluminescence

Ion-beam-induced luminescence (IBIL) measurements were performed in Cr-doped β-Ga(2)O(3) using both protons and helium ions, showing a strong enhancement of the Cr(3+) luminescence upon ion irradiation. Theoretical modelling of the IBIL intensity curves as a function of the fluence allowed estimating the effective cross-sections associated with the defect-induced IBIL enhancement and quenching processes. The results suggest that sensitizing the Cr(3+) luminescence is more efficient for H(+) than for He(+) irradiation. Thermoluminescence (TL) studies were performed in the pristine sample, with no TL signal being observed in the spectral region corresponding to the Cr(3+) emission. In agreement with the IBIL study, upon ion irradiation (with either protons or helium ions), this TL emission is activated. Moreover, it can be quenched by annealing at 923 K for 10 s, thus revealing the role played by the defects induced by the irradiation. These results show that the irradiation-induced defects play a major role in the activation of the Cr(3+) luminescence, a fact that can be exploited for radiation sensing and dosimetry.