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Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning

Defect inspection is essential in the semiconductor industry to fabricate printed circuit boards (PCBs) with minimum defect rates. However, conventional inspection systems are labor-intensive and time-consuming. In this study, a semi-supervised learning (SSL)-based model called PCB_SS was developed....

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Autores principales: Pham, Thi Tram Anh, Thoi, Do Kieu Trang, Choi, Hyohoon, Park, Suhyun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10051373/
https://www.ncbi.nlm.nih.gov/pubmed/36991958
http://dx.doi.org/10.3390/s23063246
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author Pham, Thi Tram Anh
Thoi, Do Kieu Trang
Choi, Hyohoon
Park, Suhyun
author_facet Pham, Thi Tram Anh
Thoi, Do Kieu Trang
Choi, Hyohoon
Park, Suhyun
author_sort Pham, Thi Tram Anh
collection PubMed
description Defect inspection is essential in the semiconductor industry to fabricate printed circuit boards (PCBs) with minimum defect rates. However, conventional inspection systems are labor-intensive and time-consuming. In this study, a semi-supervised learning (SSL)-based model called PCB_SS was developed. It was trained using labeled and unlabeled images under two different augmentations. Training and test PCB images were acquired using automatic final vision inspection systems. The PCB_SS model outperformed a completely supervised model trained using only labeled images (PCB_FS). The performance of the PCB_SS model was more robust than that of the PCB_FS model when the number of labeled data is limited or comprises incorrectly labeled data. In an error-resilience test, the proposed PCB_SS model maintained stable accuracy (error increment of less than 0.5%, compared with 4% for PCB_FS) for noisy training data (with as much as 9.0% of the data labeled incorrectly). The proposed model also showed superior performance when comparing machine-learning and deep-learning classifiers. The unlabeled data utilized in the PCB_SS model helped with the generalization of the deep-learning model and improved its performance for PCB defect detection. Thus, the proposed method alleviates the burden of the manual labeling process and provides a rapid and accurate automatic classifier for PCB inspections.
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spelling pubmed-100513732023-03-30 Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning Pham, Thi Tram Anh Thoi, Do Kieu Trang Choi, Hyohoon Park, Suhyun Sensors (Basel) Article Defect inspection is essential in the semiconductor industry to fabricate printed circuit boards (PCBs) with minimum defect rates. However, conventional inspection systems are labor-intensive and time-consuming. In this study, a semi-supervised learning (SSL)-based model called PCB_SS was developed. It was trained using labeled and unlabeled images under two different augmentations. Training and test PCB images were acquired using automatic final vision inspection systems. The PCB_SS model outperformed a completely supervised model trained using only labeled images (PCB_FS). The performance of the PCB_SS model was more robust than that of the PCB_FS model when the number of labeled data is limited or comprises incorrectly labeled data. In an error-resilience test, the proposed PCB_SS model maintained stable accuracy (error increment of less than 0.5%, compared with 4% for PCB_FS) for noisy training data (with as much as 9.0% of the data labeled incorrectly). The proposed model also showed superior performance when comparing machine-learning and deep-learning classifiers. The unlabeled data utilized in the PCB_SS model helped with the generalization of the deep-learning model and improved its performance for PCB defect detection. Thus, the proposed method alleviates the burden of the manual labeling process and provides a rapid and accurate automatic classifier for PCB inspections. MDPI 2023-03-19 /pmc/articles/PMC10051373/ /pubmed/36991958 http://dx.doi.org/10.3390/s23063246 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Pham, Thi Tram Anh
Thoi, Do Kieu Trang
Choi, Hyohoon
Park, Suhyun
Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning
title Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning
title_full Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning
title_fullStr Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning
title_full_unstemmed Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning
title_short Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning
title_sort defect detection in printed circuit boards using semi-supervised learning
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10051373/
https://www.ncbi.nlm.nih.gov/pubmed/36991958
http://dx.doi.org/10.3390/s23063246
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