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Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles

The study described in this paper was conducted in the framework of the European nPSize project (EMPIR program) with the main objective of proposing new reference certified nanomaterials for the market in order to improve the reliability and traceability of nanoparticle size measurements. For this p...

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Autores principales: Feltin, Nicolas, Crouzier, Loïc, Delvallée, Alexandra, Pellegrino, Francesco, Maurino, Valter, Bartczak, Dorota, Goenaga-Infante, Heidi, Taché, Olivier, Marguet, Sylvie, Testard, Fabienne, Artous, Sébastien, Saint-Antonin, François, Salzmann, Christoph, Deumer, Jérôme, Gollwitzer, Christian, Koops, Richard, Sebaïhi, Noham, Fontanges, Richard, Neuwirth, Matthias, Bergmann, Detlef, Hüser, Dorothee, Klein, Tobias, Hodoroaba, Vasile-Dan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10057439/
https://www.ncbi.nlm.nih.gov/pubmed/36985886
http://dx.doi.org/10.3390/nano13060993
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author Feltin, Nicolas
Crouzier, Loïc
Delvallée, Alexandra
Pellegrino, Francesco
Maurino, Valter
Bartczak, Dorota
Goenaga-Infante, Heidi
Taché, Olivier
Marguet, Sylvie
Testard, Fabienne
Artous, Sébastien
Saint-Antonin, François
Salzmann, Christoph
Deumer, Jérôme
Gollwitzer, Christian
Koops, Richard
Sebaïhi, Noham
Fontanges, Richard
Neuwirth, Matthias
Bergmann, Detlef
Hüser, Dorothee
Klein, Tobias
Hodoroaba, Vasile-Dan
author_facet Feltin, Nicolas
Crouzier, Loïc
Delvallée, Alexandra
Pellegrino, Francesco
Maurino, Valter
Bartczak, Dorota
Goenaga-Infante, Heidi
Taché, Olivier
Marguet, Sylvie
Testard, Fabienne
Artous, Sébastien
Saint-Antonin, François
Salzmann, Christoph
Deumer, Jérôme
Gollwitzer, Christian
Koops, Richard
Sebaïhi, Noham
Fontanges, Richard
Neuwirth, Matthias
Bergmann, Detlef
Hüser, Dorothee
Klein, Tobias
Hodoroaba, Vasile-Dan
author_sort Feltin, Nicolas
collection PubMed
description The study described in this paper was conducted in the framework of the European nPSize project (EMPIR program) with the main objective of proposing new reference certified nanomaterials for the market in order to improve the reliability and traceability of nanoparticle size measurements. For this purpose, bimodal populations as well as complexly shaped nanoparticles (bipyramids, cubes, and rods) were synthesized. An inter-laboratory comparison was organized for comparing the size measurements of the selected nanoparticle samples performed with electron microscopy (TEM, SEM, and TSEM), scanning probe microscopy (AFM), or small-angle X-ray scattering (SAXS). The results demonstrate good consistency of the measured size by the different techniques in cases where special care was taken for sample preparation, instrument calibration, and the clear definition of the measurand. For each characterization method, the calibration process is described and a semi-quantitative table grouping the main error sources is proposed for estimating the uncertainties associated with the measurements. Regarding microscopy-based techniques applied to complexly shaped nanoparticles, data dispersion can be observed when the size measurements are affected by the orientation of the nanoparticles on the substrate. For the most complex materials, hybrid approaches combining several complementary techniques were tested, with the outcome being that the reliability of the size results was improved.
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spelling pubmed-100574392023-03-30 Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles Feltin, Nicolas Crouzier, Loïc Delvallée, Alexandra Pellegrino, Francesco Maurino, Valter Bartczak, Dorota Goenaga-Infante, Heidi Taché, Olivier Marguet, Sylvie Testard, Fabienne Artous, Sébastien Saint-Antonin, François Salzmann, Christoph Deumer, Jérôme Gollwitzer, Christian Koops, Richard Sebaïhi, Noham Fontanges, Richard Neuwirth, Matthias Bergmann, Detlef Hüser, Dorothee Klein, Tobias Hodoroaba, Vasile-Dan Nanomaterials (Basel) Article The study described in this paper was conducted in the framework of the European nPSize project (EMPIR program) with the main objective of proposing new reference certified nanomaterials for the market in order to improve the reliability and traceability of nanoparticle size measurements. For this purpose, bimodal populations as well as complexly shaped nanoparticles (bipyramids, cubes, and rods) were synthesized. An inter-laboratory comparison was organized for comparing the size measurements of the selected nanoparticle samples performed with electron microscopy (TEM, SEM, and TSEM), scanning probe microscopy (AFM), or small-angle X-ray scattering (SAXS). The results demonstrate good consistency of the measured size by the different techniques in cases where special care was taken for sample preparation, instrument calibration, and the clear definition of the measurand. For each characterization method, the calibration process is described and a semi-quantitative table grouping the main error sources is proposed for estimating the uncertainties associated with the measurements. Regarding microscopy-based techniques applied to complexly shaped nanoparticles, data dispersion can be observed when the size measurements are affected by the orientation of the nanoparticles on the substrate. For the most complex materials, hybrid approaches combining several complementary techniques were tested, with the outcome being that the reliability of the size results was improved. MDPI 2023-03-09 /pmc/articles/PMC10057439/ /pubmed/36985886 http://dx.doi.org/10.3390/nano13060993 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Feltin, Nicolas
Crouzier, Loïc
Delvallée, Alexandra
Pellegrino, Francesco
Maurino, Valter
Bartczak, Dorota
Goenaga-Infante, Heidi
Taché, Olivier
Marguet, Sylvie
Testard, Fabienne
Artous, Sébastien
Saint-Antonin, François
Salzmann, Christoph
Deumer, Jérôme
Gollwitzer, Christian
Koops, Richard
Sebaïhi, Noham
Fontanges, Richard
Neuwirth, Matthias
Bergmann, Detlef
Hüser, Dorothee
Klein, Tobias
Hodoroaba, Vasile-Dan
Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles
title Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles
title_full Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles
title_fullStr Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles
title_full_unstemmed Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles
title_short Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles
title_sort metrological protocols for reaching reliable and si-traceable size results for multi-modal and complexly shaped reference nanoparticles
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10057439/
https://www.ncbi.nlm.nih.gov/pubmed/36985886
http://dx.doi.org/10.3390/nano13060993
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