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Enhancement of pattern quality in maskless plasmonic lithography via spatial loss modulation

Plasmonic lithography, which uses the evanescent electromagnetic (EM) fields to generate image beyond the diffraction limit, has been successfully demonstrated as an alternative lithographic technology for creating sub-10 nm patterns. However, the obtained photoresist pattern contour in general exhi...

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Detalles Bibliográficos
Autores principales: Han, Dandan, Deng, Sen, Ye, Tianchun, Wei, Yayi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10060221/
https://www.ncbi.nlm.nih.gov/pubmed/37007604
http://dx.doi.org/10.1038/s41378-023-00512-4