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Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials
[Image: see text] Reactions of radiation-produced secondary electrons (SEs) with biomacromolecules (e.g., DNA) are considered one of the primary causes of radiation-induced cell death. In this Review, we summarize the latest developments in the modeling of SE attachment-induced radiation damage. The...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2023
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10061531/ https://www.ncbi.nlm.nih.gov/pubmed/37008102 http://dx.doi.org/10.1021/acsomega.2c06776 |
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author | Narayanan S J, Jishnu Tripathi, Divya Verma, Pooja Adhikary, Amitava Dutta, Achintya Kumar |
author_facet | Narayanan S J, Jishnu Tripathi, Divya Verma, Pooja Adhikary, Amitava Dutta, Achintya Kumar |
author_sort | Narayanan S J, Jishnu |
collection | PubMed |
description | [Image: see text] Reactions of radiation-produced secondary electrons (SEs) with biomacromolecules (e.g., DNA) are considered one of the primary causes of radiation-induced cell death. In this Review, we summarize the latest developments in the modeling of SE attachment-induced radiation damage. The initial attachment of electrons to genetic materials has traditionally been attributed to the temporary bound or resonance states. Recent studies have, however, indicated an alternative possibility with two steps. First, the dipole-bound states act as a doorway for electron capture. Subsequently, the electron gets transferred to the valence-bound state, in which the electron is localized on the nucleobase. The transfer from the dipole-bound to valence-bound state happens through a mixing of electronic and nuclear degrees of freedom. In the presence of aqueous media, the water-bound states act as the doorway state, which is similar to that of the presolvated electron. Electron transfer from the initial doorway state to the nucleobase-bound state in the presence of bulk aqueous media happens on an ultrafast time scale, and it can account for the decrease in DNA strand breaks in aqueous environments. Analyses of the theoretically obtained results along with experimental data have also been discussed. |
format | Online Article Text |
id | pubmed-10061531 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | American Chemical Society |
record_format | MEDLINE/PubMed |
spelling | pubmed-100615312023-03-31 Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials Narayanan S J, Jishnu Tripathi, Divya Verma, Pooja Adhikary, Amitava Dutta, Achintya Kumar ACS Omega [Image: see text] Reactions of radiation-produced secondary electrons (SEs) with biomacromolecules (e.g., DNA) are considered one of the primary causes of radiation-induced cell death. In this Review, we summarize the latest developments in the modeling of SE attachment-induced radiation damage. The initial attachment of electrons to genetic materials has traditionally been attributed to the temporary bound or resonance states. Recent studies have, however, indicated an alternative possibility with two steps. First, the dipole-bound states act as a doorway for electron capture. Subsequently, the electron gets transferred to the valence-bound state, in which the electron is localized on the nucleobase. The transfer from the dipole-bound to valence-bound state happens through a mixing of electronic and nuclear degrees of freedom. In the presence of aqueous media, the water-bound states act as the doorway state, which is similar to that of the presolvated electron. Electron transfer from the initial doorway state to the nucleobase-bound state in the presence of bulk aqueous media happens on an ultrafast time scale, and it can account for the decrease in DNA strand breaks in aqueous environments. Analyses of the theoretically obtained results along with experimental data have also been discussed. American Chemical Society 2023-03-15 /pmc/articles/PMC10061531/ /pubmed/37008102 http://dx.doi.org/10.1021/acsomega.2c06776 Text en © 2023 The Authors. Published by American Chemical Society https://creativecommons.org/licenses/by-nc-nd/4.0/Permits non-commercial access and re-use, provided that author attribution and integrity are maintained; but does not permit creation of adaptations or other derivative works (https://creativecommons.org/licenses/by-nc-nd/4.0/). |
spellingShingle | Narayanan S J, Jishnu Tripathi, Divya Verma, Pooja Adhikary, Amitava Dutta, Achintya Kumar Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials |
title | Secondary Electron
Attachment-Induced Radiation Damage
to Genetic Materials |
title_full | Secondary Electron
Attachment-Induced Radiation Damage
to Genetic Materials |
title_fullStr | Secondary Electron
Attachment-Induced Radiation Damage
to Genetic Materials |
title_full_unstemmed | Secondary Electron
Attachment-Induced Radiation Damage
to Genetic Materials |
title_short | Secondary Electron
Attachment-Induced Radiation Damage
to Genetic Materials |
title_sort | secondary electron
attachment-induced radiation damage
to genetic materials |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10061531/ https://www.ncbi.nlm.nih.gov/pubmed/37008102 http://dx.doi.org/10.1021/acsomega.2c06776 |
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