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Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections
A band width determination using the first derivative of the band profile systematically underestimates the true Bragg angle. Corrections are proposed to compensate for the resulting offset Δa/a of the mean lattice parameters derived from as many Kikuchi band widths as possible. For dynamically simu...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10077852/ https://www.ncbi.nlm.nih.gov/pubmed/37032975 http://dx.doi.org/10.1107/S1600576723000146 |
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author | Nolze, Gert Tokarski, Tomasz Rychłowski, Łukasz |
author_facet | Nolze, Gert Tokarski, Tomasz Rychłowski, Łukasz |
author_sort | Nolze, Gert |
collection | PubMed |
description | A band width determination using the first derivative of the band profile systematically underestimates the true Bragg angle. Corrections are proposed to compensate for the resulting offset Δa/a of the mean lattice parameters derived from as many Kikuchi band widths as possible. For dynamically simulated Kikuchi patterns, Δa/a can reach up to 8% for phases with a high mean atomic number Z , whereas for much more common low-Z materials the offset decreases linearly. A predicted offset Δa/a = f( Z ) is therefore proposed, which also includes the unit-cell volume and thus takes into account the packing density of the scatterers in the material. Since Z is not always available for unknown phases, its substitution by Z (max), i.e. the atomic number of the heaviest element in the compound, is still acceptable for an approximate correction. For simulated Kikuchi patterns the offset-corrected lattice parameter deviation is Δa/a < 1.5%. The lattice parameter ratios, and the angles α, β and γ between the basis vectors, are not affected at all. |
format | Online Article Text |
id | pubmed-10077852 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-100778522023-04-07 Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections Nolze, Gert Tokarski, Tomasz Rychłowski, Łukasz J Appl Crystallogr Research Papers A band width determination using the first derivative of the band profile systematically underestimates the true Bragg angle. Corrections are proposed to compensate for the resulting offset Δa/a of the mean lattice parameters derived from as many Kikuchi band widths as possible. For dynamically simulated Kikuchi patterns, Δa/a can reach up to 8% for phases with a high mean atomic number Z , whereas for much more common low-Z materials the offset decreases linearly. A predicted offset Δa/a = f( Z ) is therefore proposed, which also includes the unit-cell volume and thus takes into account the packing density of the scatterers in the material. Since Z is not always available for unknown phases, its substitution by Z (max), i.e. the atomic number of the heaviest element in the compound, is still acceptable for an approximate correction. For simulated Kikuchi patterns the offset-corrected lattice parameter deviation is Δa/a < 1.5%. The lattice parameter ratios, and the angles α, β and γ between the basis vectors, are not affected at all. International Union of Crystallography 2023-02-24 /pmc/articles/PMC10077852/ /pubmed/37032975 http://dx.doi.org/10.1107/S1600576723000146 Text en © Gert Nolze et al. 2023 https://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. |
spellingShingle | Research Papers Nolze, Gert Tokarski, Tomasz Rychłowski, Łukasz Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections |
title | Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections |
title_full | Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections |
title_fullStr | Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections |
title_full_unstemmed | Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections |
title_short | Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections |
title_sort | use of electron backscatter diffraction patterns to determine the crystal lattice. part 2. offset corrections |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10077852/ https://www.ncbi.nlm.nih.gov/pubmed/37032975 http://dx.doi.org/10.1107/S1600576723000146 |
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