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Toward a better modulus at shallow indentations—Enhanced tip and sample characterization for quantitative atomic force microscopy
Approximations of the geometry of indenting probes, particularly when using shallow indentations on soft materials, can lead to the erroneous reporting of mechanical data in atomic force microscopy (AFM). Scanning electron microscopy (SEM) identified a marked change in geometry toward the tip apex w...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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John Wiley & Sons, Inc.
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10099859/ https://www.ncbi.nlm.nih.gov/pubmed/36398794 http://dx.doi.org/10.1002/jemt.24261 |