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Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy

[Image: see text] Although various spectroscopic methods have been developed to capture ion-concentration profile changes, it is still difficult to visualize the ion-concentration profile and surface topographical changes simultaneously during the charging/discharging of lithium-ion batteries (LIBs)...

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Autores principales: Takahashi, Yasufumi, Takamatsu, Daiko, Korchev, Yuri, Fukuma, Takeshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2023
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10131198/
https://www.ncbi.nlm.nih.gov/pubmed/37124299
http://dx.doi.org/10.1021/jacsau.2c00677
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author Takahashi, Yasufumi
Takamatsu, Daiko
Korchev, Yuri
Fukuma, Takeshi
author_facet Takahashi, Yasufumi
Takamatsu, Daiko
Korchev, Yuri
Fukuma, Takeshi
author_sort Takahashi, Yasufumi
collection PubMed
description [Image: see text] Although various spectroscopic methods have been developed to capture ion-concentration profile changes, it is still difficult to visualize the ion-concentration profile and surface topographical changes simultaneously during the charging/discharging of lithium-ion batteries (LIBs). To tackle this issue, we have developed an operando scanning ion conductance microscopy (SICM) method that can directly visualize an ion-concentration profile and surface topography using a SICM nanopipette while controlling the sample potential or current with a potentiostat for characterizing the polarization state during charging/discharging. Using operando SICM on the negative electrode (anode) of LIBs, we have characterized ion-concentration profile changes and the reversible volume changes related to the phase transition during cyclic voltammetry (CV) and charge/discharge of the graphite anode. Operando SICM is a versatile technique that is likely to be of major value for evaluating the correlation between the electrolyte concentration profile and nanoscale surface topography changes.
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spelling pubmed-101311982023-04-27 Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy Takahashi, Yasufumi Takamatsu, Daiko Korchev, Yuri Fukuma, Takeshi JACS Au [Image: see text] Although various spectroscopic methods have been developed to capture ion-concentration profile changes, it is still difficult to visualize the ion-concentration profile and surface topographical changes simultaneously during the charging/discharging of lithium-ion batteries (LIBs). To tackle this issue, we have developed an operando scanning ion conductance microscopy (SICM) method that can directly visualize an ion-concentration profile and surface topography using a SICM nanopipette while controlling the sample potential or current with a potentiostat for characterizing the polarization state during charging/discharging. Using operando SICM on the negative electrode (anode) of LIBs, we have characterized ion-concentration profile changes and the reversible volume changes related to the phase transition during cyclic voltammetry (CV) and charge/discharge of the graphite anode. Operando SICM is a versatile technique that is likely to be of major value for evaluating the correlation between the electrolyte concentration profile and nanoscale surface topography changes. American Chemical Society 2023-02-27 /pmc/articles/PMC10131198/ /pubmed/37124299 http://dx.doi.org/10.1021/jacsau.2c00677 Text en © 2023 The Authors. Published by American Chemical Society https://creativecommons.org/licenses/by-nc-nd/4.0/Permits non-commercial access and re-use, provided that author attribution and integrity are maintained; but does not permit creation of adaptations or other derivative works (https://creativecommons.org/licenses/by-nc-nd/4.0/).
spellingShingle Takahashi, Yasufumi
Takamatsu, Daiko
Korchev, Yuri
Fukuma, Takeshi
Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy
title Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy
title_full Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy
title_fullStr Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy
title_full_unstemmed Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy
title_short Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy
title_sort correlative analysis of ion-concentration profile and surface nanoscale topography changes using operando scanning ion conductance microscopy
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10131198/
https://www.ncbi.nlm.nih.gov/pubmed/37124299
http://dx.doi.org/10.1021/jacsau.2c00677
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