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Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy
[Image: see text] Although various spectroscopic methods have been developed to capture ion-concentration profile changes, it is still difficult to visualize the ion-concentration profile and surface topographical changes simultaneously during the charging/discharging of lithium-ion batteries (LIBs)...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2023
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10131198/ https://www.ncbi.nlm.nih.gov/pubmed/37124299 http://dx.doi.org/10.1021/jacsau.2c00677 |
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author | Takahashi, Yasufumi Takamatsu, Daiko Korchev, Yuri Fukuma, Takeshi |
author_facet | Takahashi, Yasufumi Takamatsu, Daiko Korchev, Yuri Fukuma, Takeshi |
author_sort | Takahashi, Yasufumi |
collection | PubMed |
description | [Image: see text] Although various spectroscopic methods have been developed to capture ion-concentration profile changes, it is still difficult to visualize the ion-concentration profile and surface topographical changes simultaneously during the charging/discharging of lithium-ion batteries (LIBs). To tackle this issue, we have developed an operando scanning ion conductance microscopy (SICM) method that can directly visualize an ion-concentration profile and surface topography using a SICM nanopipette while controlling the sample potential or current with a potentiostat for characterizing the polarization state during charging/discharging. Using operando SICM on the negative electrode (anode) of LIBs, we have characterized ion-concentration profile changes and the reversible volume changes related to the phase transition during cyclic voltammetry (CV) and charge/discharge of the graphite anode. Operando SICM is a versatile technique that is likely to be of major value for evaluating the correlation between the electrolyte concentration profile and nanoscale surface topography changes. |
format | Online Article Text |
id | pubmed-10131198 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | American Chemical Society |
record_format | MEDLINE/PubMed |
spelling | pubmed-101311982023-04-27 Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy Takahashi, Yasufumi Takamatsu, Daiko Korchev, Yuri Fukuma, Takeshi JACS Au [Image: see text] Although various spectroscopic methods have been developed to capture ion-concentration profile changes, it is still difficult to visualize the ion-concentration profile and surface topographical changes simultaneously during the charging/discharging of lithium-ion batteries (LIBs). To tackle this issue, we have developed an operando scanning ion conductance microscopy (SICM) method that can directly visualize an ion-concentration profile and surface topography using a SICM nanopipette while controlling the sample potential or current with a potentiostat for characterizing the polarization state during charging/discharging. Using operando SICM on the negative electrode (anode) of LIBs, we have characterized ion-concentration profile changes and the reversible volume changes related to the phase transition during cyclic voltammetry (CV) and charge/discharge of the graphite anode. Operando SICM is a versatile technique that is likely to be of major value for evaluating the correlation between the electrolyte concentration profile and nanoscale surface topography changes. American Chemical Society 2023-02-27 /pmc/articles/PMC10131198/ /pubmed/37124299 http://dx.doi.org/10.1021/jacsau.2c00677 Text en © 2023 The Authors. Published by American Chemical Society https://creativecommons.org/licenses/by-nc-nd/4.0/Permits non-commercial access and re-use, provided that author attribution and integrity are maintained; but does not permit creation of adaptations or other derivative works (https://creativecommons.org/licenses/by-nc-nd/4.0/). |
spellingShingle | Takahashi, Yasufumi Takamatsu, Daiko Korchev, Yuri Fukuma, Takeshi Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy |
title | Correlative Analysis
of Ion-Concentration Profile
and Surface Nanoscale Topography Changes Using Operando Scanning Ion
Conductance Microscopy |
title_full | Correlative Analysis
of Ion-Concentration Profile
and Surface Nanoscale Topography Changes Using Operando Scanning Ion
Conductance Microscopy |
title_fullStr | Correlative Analysis
of Ion-Concentration Profile
and Surface Nanoscale Topography Changes Using Operando Scanning Ion
Conductance Microscopy |
title_full_unstemmed | Correlative Analysis
of Ion-Concentration Profile
and Surface Nanoscale Topography Changes Using Operando Scanning Ion
Conductance Microscopy |
title_short | Correlative Analysis
of Ion-Concentration Profile
and Surface Nanoscale Topography Changes Using Operando Scanning Ion
Conductance Microscopy |
title_sort | correlative analysis
of ion-concentration profile
and surface nanoscale topography changes using operando scanning ion
conductance microscopy |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10131198/ https://www.ncbi.nlm.nih.gov/pubmed/37124299 http://dx.doi.org/10.1021/jacsau.2c00677 |
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