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Machine-learning-assisted rational design of 2D doped tellurene for fin field-effect transistor devices
Fin field-effect transistors (FinFETs) have been widely used in electronic devices on account of their excellent performance, but this new type of device is facing many challenges because of size constraints. Two-dimensional (2D) materials with a layer structure can meet the required thickness of Fi...
Autores principales: | Chen, An, Ye, Simin, Wang, Zhilong, Han, Yanqiang, Cai, Junfei, Li, Jinjin |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Elsevier
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10140614/ https://www.ncbi.nlm.nih.gov/pubmed/37123447 http://dx.doi.org/10.1016/j.patter.2023.100722 |
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