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Evaluation of Microwave Synthesis of Ceramic Pigments Based on In Situ Dielectric Characterization
The application of microwave technology for efficient and environmentally friendly synthesis of ceramic pigments is a successful and rapidly evolving area of research. However, a clear understanding of the reactions and their relationship with the material absorbance has not been fully achieved. The...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10142288/ https://www.ncbi.nlm.nih.gov/pubmed/37109812 http://dx.doi.org/10.3390/ma16082976 |
Sumario: | The application of microwave technology for efficient and environmentally friendly synthesis of ceramic pigments is a successful and rapidly evolving area of research. However, a clear understanding of the reactions and their relationship with the material absorbance has not been fully achieved. The present study introduces an in situ permittivity characterization technique, which serves as an innovative and precise tool for assessing the microwave synthesis of ceramic pigments. Several processing parameters (atmosphere, the heating rate, raw mixture composition and particle size) were evaluated by studying the permittivity curves as a function of temperature to elucidate their effect on the synthesis temperature and the final pigment quality. The validity of the proposed approach was verified through correlation with other well-known analysis techniques, such as DSC or XRD, providing valuable information about the reaction mechanisms and the optimum conditions for the synthesis process. In particular, changes in permittivity curves were linked, for the first time, to undesired metal oxide reduction at too-high heating rates and could be used to detect pigment synthesis failures and ensure product quality. The proposed dielectric analysis was also found to be a useful tool for optimizing raw material composition for the microwave process, including the use of chromium with lower specific surface area and flux removal. |
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