Cargando…

A Low-Stress Method for Determining Static and Dynamic Material Parameters for Vibration Isolation with the Use of VMQ Silicone

Progressive urbanisation causes building users to be affected by increasing amounts of noise and vibrations that come from transportation and other building users. This article presents a test method that can be used to identify quantities of methyl vinyl silicone rubber (VMQ) necessary to carry out...

Descripción completa

Detalles Bibliográficos
Autores principales: Nering, Krzysztof, Nering, Konrad
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10142812/
https://www.ncbi.nlm.nih.gov/pubmed/37109796
http://dx.doi.org/10.3390/ma16082960
_version_ 1785033701889933312
author Nering, Krzysztof
Nering, Konrad
author_facet Nering, Krzysztof
Nering, Konrad
author_sort Nering, Krzysztof
collection PubMed
description Progressive urbanisation causes building users to be affected by increasing amounts of noise and vibrations that come from transportation and other building users. This article presents a test method that can be used to identify quantities of methyl vinyl silicone rubber (VMQ) necessary to carry out solid mechanics finite element method simulations such as Young’s modulus, Poisson ratio, and damping parameters. These parameters are necessary to model the vibration isolation used for protection against noise and vibration. The article uses an original combination of dynamic response spectrum and image processing methods to determine these quantities. The tests were carried out using one machine for the range of normal compressive stresses of 64–255 kPa with cylindrical samples of various shape factors in the range of 1–0.25. The parameters for the simulation of solid mechanics in statics were obtained from image processing based on the deformation of the sample under load; for dynamic solid mechanics, the parameters were obtained from the response spectrum of the tested system. The article shows the possibility of determining the given quantities using the original method of the synthesis of dynamic response and FEM-supported image analysis, which states the article’s novelty. Additionally, limitations and preferred ranges of sample deformation in terms of load stress and shape factor are presented.
format Online
Article
Text
id pubmed-10142812
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-101428122023-04-29 A Low-Stress Method for Determining Static and Dynamic Material Parameters for Vibration Isolation with the Use of VMQ Silicone Nering, Krzysztof Nering, Konrad Materials (Basel) Article Progressive urbanisation causes building users to be affected by increasing amounts of noise and vibrations that come from transportation and other building users. This article presents a test method that can be used to identify quantities of methyl vinyl silicone rubber (VMQ) necessary to carry out solid mechanics finite element method simulations such as Young’s modulus, Poisson ratio, and damping parameters. These parameters are necessary to model the vibration isolation used for protection against noise and vibration. The article uses an original combination of dynamic response spectrum and image processing methods to determine these quantities. The tests were carried out using one machine for the range of normal compressive stresses of 64–255 kPa with cylindrical samples of various shape factors in the range of 1–0.25. The parameters for the simulation of solid mechanics in statics were obtained from image processing based on the deformation of the sample under load; for dynamic solid mechanics, the parameters were obtained from the response spectrum of the tested system. The article shows the possibility of determining the given quantities using the original method of the synthesis of dynamic response and FEM-supported image analysis, which states the article’s novelty. Additionally, limitations and preferred ranges of sample deformation in terms of load stress and shape factor are presented. MDPI 2023-04-07 /pmc/articles/PMC10142812/ /pubmed/37109796 http://dx.doi.org/10.3390/ma16082960 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Nering, Krzysztof
Nering, Konrad
A Low-Stress Method for Determining Static and Dynamic Material Parameters for Vibration Isolation with the Use of VMQ Silicone
title A Low-Stress Method for Determining Static and Dynamic Material Parameters for Vibration Isolation with the Use of VMQ Silicone
title_full A Low-Stress Method for Determining Static and Dynamic Material Parameters for Vibration Isolation with the Use of VMQ Silicone
title_fullStr A Low-Stress Method for Determining Static and Dynamic Material Parameters for Vibration Isolation with the Use of VMQ Silicone
title_full_unstemmed A Low-Stress Method for Determining Static and Dynamic Material Parameters for Vibration Isolation with the Use of VMQ Silicone
title_short A Low-Stress Method for Determining Static and Dynamic Material Parameters for Vibration Isolation with the Use of VMQ Silicone
title_sort low-stress method for determining static and dynamic material parameters for vibration isolation with the use of vmq silicone
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10142812/
https://www.ncbi.nlm.nih.gov/pubmed/37109796
http://dx.doi.org/10.3390/ma16082960
work_keys_str_mv AT neringkrzysztof alowstressmethodfordeterminingstaticanddynamicmaterialparametersforvibrationisolationwiththeuseofvmqsilicone
AT neringkonrad alowstressmethodfordeterminingstaticanddynamicmaterialparametersforvibrationisolationwiththeuseofvmqsilicone
AT neringkrzysztof lowstressmethodfordeterminingstaticanddynamicmaterialparametersforvibrationisolationwiththeuseofvmqsilicone
AT neringkonrad lowstressmethodfordeterminingstaticanddynamicmaterialparametersforvibrationisolationwiththeuseofvmqsilicone