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Measuring the Flex Life of Conductive Yarns in Narrow Fabric

Due to constant advancements in materials research, conductive textile-based materials have been used increasingly in textile-based wearables. However, due to the rigidity of electronics or the need for their encapsulation, conductive textile materials, such as conductive yarns, tend to break faster...

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Detalles Bibliográficos
Autores principales: Veske, Paula, Bossuyt, Frederick, Thielemans, Filip, Vanfleteren, Jan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10145945/
https://www.ncbi.nlm.nih.gov/pubmed/37421014
http://dx.doi.org/10.3390/mi14040781
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author Veske, Paula
Bossuyt, Frederick
Thielemans, Filip
Vanfleteren, Jan
author_facet Veske, Paula
Bossuyt, Frederick
Thielemans, Filip
Vanfleteren, Jan
author_sort Veske, Paula
collection PubMed
description Due to constant advancements in materials research, conductive textile-based materials have been used increasingly in textile-based wearables. However, due to the rigidity of electronics or the need for their encapsulation, conductive textile materials, such as conductive yarns, tend to break faster around transition areas than other parts of e-textile systems. Thus, the current work aims to find the limits of two conductive yarns woven into a narrow fabric at the electronics encapsulation transition point. The tests consisted of repeated bending and mechanical stress, and were conducted using a testing machine built from off-the-shelf components. The electronics were encapsulated with an injection-moulded potting compound. In addition to identifying the most reliable conductive yarn and soft–rigid transition materials, the results examined the failure process during the bending tests, including continuous electrical measurements.
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spelling pubmed-101459452023-04-29 Measuring the Flex Life of Conductive Yarns in Narrow Fabric Veske, Paula Bossuyt, Frederick Thielemans, Filip Vanfleteren, Jan Micromachines (Basel) Article Due to constant advancements in materials research, conductive textile-based materials have been used increasingly in textile-based wearables. However, due to the rigidity of electronics or the need for their encapsulation, conductive textile materials, such as conductive yarns, tend to break faster around transition areas than other parts of e-textile systems. Thus, the current work aims to find the limits of two conductive yarns woven into a narrow fabric at the electronics encapsulation transition point. The tests consisted of repeated bending and mechanical stress, and were conducted using a testing machine built from off-the-shelf components. The electronics were encapsulated with an injection-moulded potting compound. In addition to identifying the most reliable conductive yarn and soft–rigid transition materials, the results examined the failure process during the bending tests, including continuous electrical measurements. MDPI 2023-03-30 /pmc/articles/PMC10145945/ /pubmed/37421014 http://dx.doi.org/10.3390/mi14040781 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Veske, Paula
Bossuyt, Frederick
Thielemans, Filip
Vanfleteren, Jan
Measuring the Flex Life of Conductive Yarns in Narrow Fabric
title Measuring the Flex Life of Conductive Yarns in Narrow Fabric
title_full Measuring the Flex Life of Conductive Yarns in Narrow Fabric
title_fullStr Measuring the Flex Life of Conductive Yarns in Narrow Fabric
title_full_unstemmed Measuring the Flex Life of Conductive Yarns in Narrow Fabric
title_short Measuring the Flex Life of Conductive Yarns in Narrow Fabric
title_sort measuring the flex life of conductive yarns in narrow fabric
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10145945/
https://www.ncbi.nlm.nih.gov/pubmed/37421014
http://dx.doi.org/10.3390/mi14040781
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