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A Pixel Circuit for Compensating Electrical Characteristics Variation and OLED Degradation
In recent years, the active-matrix organic light-emitting diode (AMOLED) displays have been greatly required. A voltage compensation pixel circuit based on an amorphous indium gallium zinc oxide thin-film transistor is presented for AMOLED displays. The circuit is composed of five transistors–two ca...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10146851/ https://www.ncbi.nlm.nih.gov/pubmed/37421090 http://dx.doi.org/10.3390/mi14040857 |
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author | Wei, Ning Chu, Hongzhen Yu, Bo Zhao, Huicheng Li, Yuehua Wang, Xinlin He, Hongyu |
author_facet | Wei, Ning Chu, Hongzhen Yu, Bo Zhao, Huicheng Li, Yuehua Wang, Xinlin He, Hongyu |
author_sort | Wei, Ning |
collection | PubMed |
description | In recent years, the active-matrix organic light-emitting diode (AMOLED) displays have been greatly required. A voltage compensation pixel circuit based on an amorphous indium gallium zinc oxide thin-film transistor is presented for AMOLED displays. The circuit is composed of five transistors–two capacitors (5T2C) in combination with an OLED. In the circuit, the threshold voltages of both the transistor and the OLED are extracted simultaneously in the threshold voltage extraction stage, and the mobility-related discharge voltage is generated in the data input stage. The circuit not only can compensate the electrical characteristics variation, i.e., the threshold voltage variation and mobility variation, but also can compensate the OLED degradation. Furthermore, the circuit can prevent the OLED flicker, and can achieve the wide data voltage range. The circuit simulation results show that the OLED current error rates (CERs) are lower than 3.89% when the transistor’s threshold voltage variation is ±0.5V, lower than 3.49% when the mobility variation is ±30%. |
format | Online Article Text |
id | pubmed-10146851 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-101468512023-04-29 A Pixel Circuit for Compensating Electrical Characteristics Variation and OLED Degradation Wei, Ning Chu, Hongzhen Yu, Bo Zhao, Huicheng Li, Yuehua Wang, Xinlin He, Hongyu Micromachines (Basel) Article In recent years, the active-matrix organic light-emitting diode (AMOLED) displays have been greatly required. A voltage compensation pixel circuit based on an amorphous indium gallium zinc oxide thin-film transistor is presented for AMOLED displays. The circuit is composed of five transistors–two capacitors (5T2C) in combination with an OLED. In the circuit, the threshold voltages of both the transistor and the OLED are extracted simultaneously in the threshold voltage extraction stage, and the mobility-related discharge voltage is generated in the data input stage. The circuit not only can compensate the electrical characteristics variation, i.e., the threshold voltage variation and mobility variation, but also can compensate the OLED degradation. Furthermore, the circuit can prevent the OLED flicker, and can achieve the wide data voltage range. The circuit simulation results show that the OLED current error rates (CERs) are lower than 3.89% when the transistor’s threshold voltage variation is ±0.5V, lower than 3.49% when the mobility variation is ±30%. MDPI 2023-04-15 /pmc/articles/PMC10146851/ /pubmed/37421090 http://dx.doi.org/10.3390/mi14040857 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Wei, Ning Chu, Hongzhen Yu, Bo Zhao, Huicheng Li, Yuehua Wang, Xinlin He, Hongyu A Pixel Circuit for Compensating Electrical Characteristics Variation and OLED Degradation |
title | A Pixel Circuit for Compensating Electrical Characteristics Variation and OLED Degradation |
title_full | A Pixel Circuit for Compensating Electrical Characteristics Variation and OLED Degradation |
title_fullStr | A Pixel Circuit for Compensating Electrical Characteristics Variation and OLED Degradation |
title_full_unstemmed | A Pixel Circuit for Compensating Electrical Characteristics Variation and OLED Degradation |
title_short | A Pixel Circuit for Compensating Electrical Characteristics Variation and OLED Degradation |
title_sort | pixel circuit for compensating electrical characteristics variation and oled degradation |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10146851/ https://www.ncbi.nlm.nih.gov/pubmed/37421090 http://dx.doi.org/10.3390/mi14040857 |
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