Cargando…
Elastic and thermo-elastic characterizations of thin resin films using colored picosecond acoustics and spectroscopic ellipsometry
Colored Picosecond Acoustics (CPA) and Spectroscopic Ellipsometry (SE) are combined to measure elastic and thermoelastic properties of polymer thin-film resins deposited on 300 mm wafers. Film thickness and refractive index are measured using SE. Sound velocity and thickness are measured using CPA f...
Autores principales: | Devos, A., Chevreux, F., Licitra, C., Chargui, A., Chapelon, L.-L. |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Elsevier
2023
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10160771/ https://www.ncbi.nlm.nih.gov/pubmed/37152401 http://dx.doi.org/10.1016/j.pacs.2023.100498 |
Ejemplares similares
-
Temperature-Dependent Spectroscopic Ellipsometry of
Thin Polymer Films
por: Hajduk, Barbara, et al.
Publicado: (2020) -
Spectroscopic ellipsometry for photovoltaics
por: Fujiwara, Hiroyuki, et al.
Publicado: (2018) -
Spectroscopic Ellipsometry of Nanocrystalline Diamond
Film Growth
por: Thomas, Evan L. H., et al.
Publicado: (2017) -
Spectroscopic Ellipsometry: Principles and Applications
por: Fujiwara, Hiroyuki
Publicado: (2007) -
Dual-comb spectroscopic ellipsometry
por: Minamikawa, Takeo, et al.
Publicado: (2017)