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Impacts of Random Atomic Defects on Critical Buckling Stress of Graphene under Different Boundary Conditions
Buckled graphene has potential applications in energy harvest, storage, conversion, and hydrogen storage. The investigation and quantification analysis of the random porosity in buckled graphene not only contributes to the performance reliability evaluation, but it also provides important references...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10179755/ https://www.ncbi.nlm.nih.gov/pubmed/37177042 http://dx.doi.org/10.3390/nano13091499 |
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author | Shi, Jiajia Chu, Liu Yu, Zhengyu Souza de Cursi, Eduardo |
author_facet | Shi, Jiajia Chu, Liu Yu, Zhengyu Souza de Cursi, Eduardo |
author_sort | Shi, Jiajia |
collection | PubMed |
description | Buckled graphene has potential applications in energy harvest, storage, conversion, and hydrogen storage. The investigation and quantification analysis of the random porosity in buckled graphene not only contributes to the performance reliability evaluation, but it also provides important references for artificial functionalization. This paper proposes a stochastic finite element model to quantify the randomly distributed porosities in pristine graphene. The Monte Carlo stochastic sampling process is combined with finite element computation to simulate the mechanical property of buckled graphene. Different boundary conditions are considered, and the corresponding results are compared. The impacts of random porosities on the buckling patterns are recorded and analyzed. Based on the large sampling space provided by the stochastic finite element model, the discrepancies caused by the number of random porosities are discussed. The possibility of strengthening effects in critical buckling stress is tracked in the large sampling space. The distinguishable interval ranges of probability density distribution for the relative variation of the critical buckling stress prove the promising potential of artificial control by the atomic vacancy amounts. In addition, the approximated Gaussian density distribution of critical buckling stress demonstrates the stochastic sampling efficiency by the Monte Carlo method and the artificial controllability of porous graphene. The results of this work provide new ideas for understanding the random porosities in buckled graphene and provide a basis for artificial functionalization through porosity controlling. |
format | Online Article Text |
id | pubmed-10179755 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-101797552023-05-13 Impacts of Random Atomic Defects on Critical Buckling Stress of Graphene under Different Boundary Conditions Shi, Jiajia Chu, Liu Yu, Zhengyu Souza de Cursi, Eduardo Nanomaterials (Basel) Article Buckled graphene has potential applications in energy harvest, storage, conversion, and hydrogen storage. The investigation and quantification analysis of the random porosity in buckled graphene not only contributes to the performance reliability evaluation, but it also provides important references for artificial functionalization. This paper proposes a stochastic finite element model to quantify the randomly distributed porosities in pristine graphene. The Monte Carlo stochastic sampling process is combined with finite element computation to simulate the mechanical property of buckled graphene. Different boundary conditions are considered, and the corresponding results are compared. The impacts of random porosities on the buckling patterns are recorded and analyzed. Based on the large sampling space provided by the stochastic finite element model, the discrepancies caused by the number of random porosities are discussed. The possibility of strengthening effects in critical buckling stress is tracked in the large sampling space. The distinguishable interval ranges of probability density distribution for the relative variation of the critical buckling stress prove the promising potential of artificial control by the atomic vacancy amounts. In addition, the approximated Gaussian density distribution of critical buckling stress demonstrates the stochastic sampling efficiency by the Monte Carlo method and the artificial controllability of porous graphene. The results of this work provide new ideas for understanding the random porosities in buckled graphene and provide a basis for artificial functionalization through porosity controlling. MDPI 2023-04-27 /pmc/articles/PMC10179755/ /pubmed/37177042 http://dx.doi.org/10.3390/nano13091499 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Shi, Jiajia Chu, Liu Yu, Zhengyu Souza de Cursi, Eduardo Impacts of Random Atomic Defects on Critical Buckling Stress of Graphene under Different Boundary Conditions |
title | Impacts of Random Atomic Defects on Critical Buckling Stress of Graphene under Different Boundary Conditions |
title_full | Impacts of Random Atomic Defects on Critical Buckling Stress of Graphene under Different Boundary Conditions |
title_fullStr | Impacts of Random Atomic Defects on Critical Buckling Stress of Graphene under Different Boundary Conditions |
title_full_unstemmed | Impacts of Random Atomic Defects on Critical Buckling Stress of Graphene under Different Boundary Conditions |
title_short | Impacts of Random Atomic Defects on Critical Buckling Stress of Graphene under Different Boundary Conditions |
title_sort | impacts of random atomic defects on critical buckling stress of graphene under different boundary conditions |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10179755/ https://www.ncbi.nlm.nih.gov/pubmed/37177042 http://dx.doi.org/10.3390/nano13091499 |
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