Cargando…
Coarse-Grained Modeling of EUV Patterning Process Reflecting Photochemical Reactions and Chain Conformations
Enabling extreme ultraviolet lithography (EUVL) as a viable and efficient sub-10 nm patterning tool requires addressing the critical issue of reducing line edge roughness (LER). Stochastic effects from random and local variability in photon distribution and photochemical reactions have been consider...
Autores principales: | Kim, Tae-Yi, Kang, In-Hwa, Park, Juhae, Kim, Myungwoong, Oh, Hye-Keun, Hur, Su-Mi |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10180770/ https://www.ncbi.nlm.nih.gov/pubmed/37177136 http://dx.doi.org/10.3390/polym15091988 |
Ejemplares similares
Cargando…
Coarse-Grained Prediction of RNA Loop Structures
por: Liu, Liang, et al.
Publicado: (2012)
por: Liu, Liang, et al.
Publicado: (2012)
Cargando…
Coarse-graining as a downward causation mechanism
por: Flack, Jessica C.
Publicado: (2017)
por: Flack, Jessica C.
Publicado: (2017)
Ejemplares similares
-
Molecular Modeling of EUV Photoresist Revealing the Effect of Chain Conformation on Line-Edge Roughness Formation
por: Park, Juhae, et al.
Publicado: (2019) -
On an EUV Atmospheric Simulation Chamber to Study the Photochemical Processes of Titan’s Atmosphere
por: Bourgalais, Jérémy, et al.
Publicado: (2020) -
Investigating the Degradation of EUV Transmittance of an EUV Pellicle Membrane
por: Wi, Seong Ju, et al.
Publicado: (2022) -
EUV lithography
por: Bakshi, Vivek
Publicado: (2018) -
Berkeley Colloquium on EUV Astronomy
Publicado: (1989)