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Measuring external primary cell wall elasticity of seedling roots using atomic force microscopy

Stiffness plays a central action in plant cell extension. Here, we present a protocol to detect changes in stiffness on the external epidermal cell wall of living plant roots using atomic force microscopy (AFM). We provide generalized instructions for collecting force-distance curves and analysis of...

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Autores principales: Kaur, Harinderbir, Teulon, Jean-Marie, Foucher, Anne-Emmanuelle, Fenel, Daphna, Chen, Shu-wen W., Godon, Christian, Desnos, Thierry, Pellequer, Jean-Luc
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10206207/
https://www.ncbi.nlm.nih.gov/pubmed/37200196
http://dx.doi.org/10.1016/j.xpro.2023.102265
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author Kaur, Harinderbir
Teulon, Jean-Marie
Foucher, Anne-Emmanuelle
Fenel, Daphna
Chen, Shu-wen W.
Godon, Christian
Desnos, Thierry
Pellequer, Jean-Luc
author_facet Kaur, Harinderbir
Teulon, Jean-Marie
Foucher, Anne-Emmanuelle
Fenel, Daphna
Chen, Shu-wen W.
Godon, Christian
Desnos, Thierry
Pellequer, Jean-Luc
author_sort Kaur, Harinderbir
collection PubMed
description Stiffness plays a central action in plant cell extension. Here, we present a protocol to detect changes in stiffness on the external epidermal cell wall of living plant roots using atomic force microscopy (AFM). We provide generalized instructions for collecting force-distance curves and analysis of stiffness using contact-based mechanical model. With this protocol, and some initial training in AFM, a user is able to perform indentation experiments on 4- and 5-day-old Arabidopsis thaliana and determine stiffness properties. For complete details on the use and execution of this protocol, please refer to Godon et al.(1)
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spelling pubmed-102062072023-05-25 Measuring external primary cell wall elasticity of seedling roots using atomic force microscopy Kaur, Harinderbir Teulon, Jean-Marie Foucher, Anne-Emmanuelle Fenel, Daphna Chen, Shu-wen W. Godon, Christian Desnos, Thierry Pellequer, Jean-Luc STAR Protoc Protocol Stiffness plays a central action in plant cell extension. Here, we present a protocol to detect changes in stiffness on the external epidermal cell wall of living plant roots using atomic force microscopy (AFM). We provide generalized instructions for collecting force-distance curves and analysis of stiffness using contact-based mechanical model. With this protocol, and some initial training in AFM, a user is able to perform indentation experiments on 4- and 5-day-old Arabidopsis thaliana and determine stiffness properties. For complete details on the use and execution of this protocol, please refer to Godon et al.(1) Elsevier 2023-05-16 /pmc/articles/PMC10206207/ /pubmed/37200196 http://dx.doi.org/10.1016/j.xpro.2023.102265 Text en © 2023 The Authors https://creativecommons.org/licenses/by-nc-nd/4.0/This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
spellingShingle Protocol
Kaur, Harinderbir
Teulon, Jean-Marie
Foucher, Anne-Emmanuelle
Fenel, Daphna
Chen, Shu-wen W.
Godon, Christian
Desnos, Thierry
Pellequer, Jean-Luc
Measuring external primary cell wall elasticity of seedling roots using atomic force microscopy
title Measuring external primary cell wall elasticity of seedling roots using atomic force microscopy
title_full Measuring external primary cell wall elasticity of seedling roots using atomic force microscopy
title_fullStr Measuring external primary cell wall elasticity of seedling roots using atomic force microscopy
title_full_unstemmed Measuring external primary cell wall elasticity of seedling roots using atomic force microscopy
title_short Measuring external primary cell wall elasticity of seedling roots using atomic force microscopy
title_sort measuring external primary cell wall elasticity of seedling roots using atomic force microscopy
topic Protocol
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10206207/
https://www.ncbi.nlm.nih.gov/pubmed/37200196
http://dx.doi.org/10.1016/j.xpro.2023.102265
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