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Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors
Understanding the electromechanical breakdown mechanisms of polycrystalline ceramics is critical to texture engineering for high‐energy‐density dielectric ceramics. Here, an electromechanical breakdown model is developed to fundamentally understand the electrostrictive effect on the breakdown behavi...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
John Wiley and Sons Inc.
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10238190/ https://www.ncbi.nlm.nih.gov/pubmed/37026615 http://dx.doi.org/10.1002/advs.202300320 |
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author | Wang, Jian Shen, Zhong‐Hui Liu, Run‐Lin Shen, Yang Chen, Long‐Qing Liu, Han‐Xing Nan, Ce‐Wen |
author_facet | Wang, Jian Shen, Zhong‐Hui Liu, Run‐Lin Shen, Yang Chen, Long‐Qing Liu, Han‐Xing Nan, Ce‐Wen |
author_sort | Wang, Jian |
collection | PubMed |
description | Understanding the electromechanical breakdown mechanisms of polycrystalline ceramics is critical to texture engineering for high‐energy‐density dielectric ceramics. Here, an electromechanical breakdown model is developed to fundamentally understand the electrostrictive effect on the breakdown behavior of textured ceramics. Taking the Na(0.5)Bi(0.5)TiO(3)‐Sr(0.7)Bi(0.2)TiO(3) ceramic as an example, it is found that the breakdown process significantly depends on the local electric/strain energy distributions in polycrystalline ceramics, and reasonable texture design could greatly alleviate electromechanical breakdown. Then, high‐throughput simulations are performed to establish the mapping relationship between the breakdown strength and different intrinsic/extrinsic variables. Finally, machine learning is conducted on the database from the high‐throughput simulations to obtain the mathematical expression for semi‐quantitatively predicting the breakdown strength, based on which some basic principles of texture design are proposed. The present work provides a computational understanding of the electromechanical breakdown behavior in textured ceramics and is expected to stimulate more theoretical and experimental efforts in designing textured ceramics with reliable electromechanical performances. |
format | Online Article Text |
id | pubmed-10238190 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | John Wiley and Sons Inc. |
record_format | MEDLINE/PubMed |
spelling | pubmed-102381902023-06-04 Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors Wang, Jian Shen, Zhong‐Hui Liu, Run‐Lin Shen, Yang Chen, Long‐Qing Liu, Han‐Xing Nan, Ce‐Wen Adv Sci (Weinh) Research Articles Understanding the electromechanical breakdown mechanisms of polycrystalline ceramics is critical to texture engineering for high‐energy‐density dielectric ceramics. Here, an electromechanical breakdown model is developed to fundamentally understand the electrostrictive effect on the breakdown behavior of textured ceramics. Taking the Na(0.5)Bi(0.5)TiO(3)‐Sr(0.7)Bi(0.2)TiO(3) ceramic as an example, it is found that the breakdown process significantly depends on the local electric/strain energy distributions in polycrystalline ceramics, and reasonable texture design could greatly alleviate electromechanical breakdown. Then, high‐throughput simulations are performed to establish the mapping relationship between the breakdown strength and different intrinsic/extrinsic variables. Finally, machine learning is conducted on the database from the high‐throughput simulations to obtain the mathematical expression for semi‐quantitatively predicting the breakdown strength, based on which some basic principles of texture design are proposed. The present work provides a computational understanding of the electromechanical breakdown behavior in textured ceramics and is expected to stimulate more theoretical and experimental efforts in designing textured ceramics with reliable electromechanical performances. John Wiley and Sons Inc. 2023-04-07 /pmc/articles/PMC10238190/ /pubmed/37026615 http://dx.doi.org/10.1002/advs.202300320 Text en © 2023 The Authors. Advanced Science published by Wiley‐VCH GmbH https://creativecommons.org/licenses/by/4.0/This is an open access article under the terms of the http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited. |
spellingShingle | Research Articles Wang, Jian Shen, Zhong‐Hui Liu, Run‐Lin Shen, Yang Chen, Long‐Qing Liu, Han‐Xing Nan, Ce‐Wen Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors |
title | Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors |
title_full | Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors |
title_fullStr | Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors |
title_full_unstemmed | Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors |
title_short | Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors |
title_sort | texture engineering modulating electromechanical breakdown in multilayer ceramic capacitors |
topic | Research Articles |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10238190/ https://www.ncbi.nlm.nih.gov/pubmed/37026615 http://dx.doi.org/10.1002/advs.202300320 |
work_keys_str_mv | AT wangjian textureengineeringmodulatingelectromechanicalbreakdowninmultilayerceramiccapacitors AT shenzhonghui textureengineeringmodulatingelectromechanicalbreakdowninmultilayerceramiccapacitors AT liurunlin textureengineeringmodulatingelectromechanicalbreakdowninmultilayerceramiccapacitors AT shenyang textureengineeringmodulatingelectromechanicalbreakdowninmultilayerceramiccapacitors AT chenlongqing textureengineeringmodulatingelectromechanicalbreakdowninmultilayerceramiccapacitors AT liuhanxing textureengineeringmodulatingelectromechanicalbreakdowninmultilayerceramiccapacitors AT nancewen textureengineeringmodulatingelectromechanicalbreakdowninmultilayerceramiccapacitors |