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Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors

Understanding the electromechanical breakdown mechanisms of polycrystalline ceramics is critical to texture engineering for high‐energy‐density dielectric ceramics. Here, an electromechanical breakdown model is developed to fundamentally understand the electrostrictive effect on the breakdown behavi...

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Autores principales: Wang, Jian, Shen, Zhong‐Hui, Liu, Run‐Lin, Shen, Yang, Chen, Long‐Qing, Liu, Han‐Xing, Nan, Ce‐Wen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10238190/
https://www.ncbi.nlm.nih.gov/pubmed/37026615
http://dx.doi.org/10.1002/advs.202300320
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author Wang, Jian
Shen, Zhong‐Hui
Liu, Run‐Lin
Shen, Yang
Chen, Long‐Qing
Liu, Han‐Xing
Nan, Ce‐Wen
author_facet Wang, Jian
Shen, Zhong‐Hui
Liu, Run‐Lin
Shen, Yang
Chen, Long‐Qing
Liu, Han‐Xing
Nan, Ce‐Wen
author_sort Wang, Jian
collection PubMed
description Understanding the electromechanical breakdown mechanisms of polycrystalline ceramics is critical to texture engineering for high‐energy‐density dielectric ceramics. Here, an electromechanical breakdown model is developed to fundamentally understand the electrostrictive effect on the breakdown behavior of textured ceramics. Taking the Na(0.5)Bi(0.5)TiO(3)‐Sr(0.7)Bi(0.2)TiO(3) ceramic as an example, it is found that the breakdown process significantly depends on the local electric/strain energy distributions in polycrystalline ceramics, and reasonable texture design could greatly alleviate electromechanical breakdown. Then, high‐throughput simulations are performed to establish the mapping relationship between the breakdown strength and different intrinsic/extrinsic variables. Finally, machine learning is conducted on the database from the high‐throughput simulations to obtain the mathematical expression for semi‐quantitatively predicting the breakdown strength, based on which some basic principles of texture design are proposed. The present work provides a computational understanding of the electromechanical breakdown behavior in textured ceramics and is expected to stimulate more theoretical and experimental efforts in designing textured ceramics with reliable electromechanical performances.
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spelling pubmed-102381902023-06-04 Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors Wang, Jian Shen, Zhong‐Hui Liu, Run‐Lin Shen, Yang Chen, Long‐Qing Liu, Han‐Xing Nan, Ce‐Wen Adv Sci (Weinh) Research Articles Understanding the electromechanical breakdown mechanisms of polycrystalline ceramics is critical to texture engineering for high‐energy‐density dielectric ceramics. Here, an electromechanical breakdown model is developed to fundamentally understand the electrostrictive effect on the breakdown behavior of textured ceramics. Taking the Na(0.5)Bi(0.5)TiO(3)‐Sr(0.7)Bi(0.2)TiO(3) ceramic as an example, it is found that the breakdown process significantly depends on the local electric/strain energy distributions in polycrystalline ceramics, and reasonable texture design could greatly alleviate electromechanical breakdown. Then, high‐throughput simulations are performed to establish the mapping relationship between the breakdown strength and different intrinsic/extrinsic variables. Finally, machine learning is conducted on the database from the high‐throughput simulations to obtain the mathematical expression for semi‐quantitatively predicting the breakdown strength, based on which some basic principles of texture design are proposed. The present work provides a computational understanding of the electromechanical breakdown behavior in textured ceramics and is expected to stimulate more theoretical and experimental efforts in designing textured ceramics with reliable electromechanical performances. John Wiley and Sons Inc. 2023-04-07 /pmc/articles/PMC10238190/ /pubmed/37026615 http://dx.doi.org/10.1002/advs.202300320 Text en © 2023 The Authors. Advanced Science published by Wiley‐VCH GmbH https://creativecommons.org/licenses/by/4.0/This is an open access article under the terms of the http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
spellingShingle Research Articles
Wang, Jian
Shen, Zhong‐Hui
Liu, Run‐Lin
Shen, Yang
Chen, Long‐Qing
Liu, Han‐Xing
Nan, Ce‐Wen
Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors
title Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors
title_full Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors
title_fullStr Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors
title_full_unstemmed Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors
title_short Texture Engineering Modulating Electromechanical Breakdown in Multilayer Ceramic Capacitors
title_sort texture engineering modulating electromechanical breakdown in multilayer ceramic capacitors
topic Research Articles
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10238190/
https://www.ncbi.nlm.nih.gov/pubmed/37026615
http://dx.doi.org/10.1002/advs.202300320
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