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Crystal bending in triple-Laue X-ray interferometry. Part I. Theory
The measured value of the (220) lattice-plane spacing of silicon 28 using scanning X-ray interferometry is essential to realize the kilogram by counting (28)Si atoms. An assumption made is that the measured lattice spacing is the bulk value of an unstrained crystal forming the analyser of the interf...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10241058/ https://www.ncbi.nlm.nih.gov/pubmed/37284270 http://dx.doi.org/10.1107/S1600576723002844 |