Single DNA Translocation and Electrical Characterization Based on Atomic Force Microscopy and Nanoelectrodes

Precision DNA translocation control is critical for achieving high accuracy in single molecule-based DNA sequencing. In this report, we describe an atomic force microscopy (AFM) based method to linearize a double-stranded DNA strand during the translocation process and characterize the electrical pr...

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Detalles Bibliográficos
Autores principales: MA, BO, KIM, JIN-WOO, TUNG, STEVE
Formato: Online Artículo Texto
Lenguaje:English
Publicado: 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10241429/
https://www.ncbi.nlm.nih.gov/pubmed/37284032
http://dx.doi.org/10.1109/ojnano.2022.3217108

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