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Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold

Practical Quantum computing hinges on the ability to control large numbers of qubits with high fidelity. Quantum dots define a promising platform due to their compatibility with semiconductor manufacturing. Moreover, high-fidelity operations above 99.9% have been realized with individual qubits, tho...

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Autores principales: Lawrie, W. I. L., Rimbach-Russ, M., Riggelen, F. van, Hendrickx, N. W., Snoo, S. L. de, Sammak, A., Scappucci, G., Helsen, J., Veldhorst, M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10279658/
https://www.ncbi.nlm.nih.gov/pubmed/37336892
http://dx.doi.org/10.1038/s41467-023-39334-3
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author Lawrie, W. I. L.
Rimbach-Russ, M.
Riggelen, F. van
Hendrickx, N. W.
Snoo, S. L. de
Sammak, A.
Scappucci, G.
Helsen, J.
Veldhorst, M.
author_facet Lawrie, W. I. L.
Rimbach-Russ, M.
Riggelen, F. van
Hendrickx, N. W.
Snoo, S. L. de
Sammak, A.
Scappucci, G.
Helsen, J.
Veldhorst, M.
author_sort Lawrie, W. I. L.
collection PubMed
description Practical Quantum computing hinges on the ability to control large numbers of qubits with high fidelity. Quantum dots define a promising platform due to their compatibility with semiconductor manufacturing. Moreover, high-fidelity operations above 99.9% have been realized with individual qubits, though their performance has been limited to 98.67% when driving two qubits simultaneously. Here we present single-qubit randomized benchmarking in a two-dimensional array of spin qubits, finding native gate fidelities as high as 99.992(1)%. Furthermore, we benchmark single qubit gate performance while simultaneously driving two and four qubits, utilizing a novel benchmarking technique called N-copy randomized benchmarking, designed for simple experimental implementation and accurate simultaneous gate fidelity estimation. We find two- and four-copy randomized benchmarking fidelities of 99.905(8)% and 99.34(4)% respectively, and that next-nearest neighbor pairs are highly robust to cross-talk errors. These characterizations of single-qubit gate quality are crucial for scaling up quantum information technology.
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spelling pubmed-102796582023-06-21 Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold Lawrie, W. I. L. Rimbach-Russ, M. Riggelen, F. van Hendrickx, N. W. Snoo, S. L. de Sammak, A. Scappucci, G. Helsen, J. Veldhorst, M. Nat Commun Article Practical Quantum computing hinges on the ability to control large numbers of qubits with high fidelity. Quantum dots define a promising platform due to their compatibility with semiconductor manufacturing. Moreover, high-fidelity operations above 99.9% have been realized with individual qubits, though their performance has been limited to 98.67% when driving two qubits simultaneously. Here we present single-qubit randomized benchmarking in a two-dimensional array of spin qubits, finding native gate fidelities as high as 99.992(1)%. Furthermore, we benchmark single qubit gate performance while simultaneously driving two and four qubits, utilizing a novel benchmarking technique called N-copy randomized benchmarking, designed for simple experimental implementation and accurate simultaneous gate fidelity estimation. We find two- and four-copy randomized benchmarking fidelities of 99.905(8)% and 99.34(4)% respectively, and that next-nearest neighbor pairs are highly robust to cross-talk errors. These characterizations of single-qubit gate quality are crucial for scaling up quantum information technology. Nature Publishing Group UK 2023-06-19 /pmc/articles/PMC10279658/ /pubmed/37336892 http://dx.doi.org/10.1038/s41467-023-39334-3 Text en © The Author(s) 2023 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Lawrie, W. I. L.
Rimbach-Russ, M.
Riggelen, F. van
Hendrickx, N. W.
Snoo, S. L. de
Sammak, A.
Scappucci, G.
Helsen, J.
Veldhorst, M.
Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold
title Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold
title_full Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold
title_fullStr Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold
title_full_unstemmed Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold
title_short Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold
title_sort simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10279658/
https://www.ncbi.nlm.nih.gov/pubmed/37336892
http://dx.doi.org/10.1038/s41467-023-39334-3
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