Cargando…

A False Trigger-Strengthened and Area-Saving Power-Rail Clamp Circuit with High ESD Performance

A power clamp circuit, which has good immunity to false trigger under fast power-on conditions with a 20 ns rising edge, is proposed in this paper. The proposed circuit has a separate detection component and an on-time control component which enable it to distinguish between electrostatic discharge...

Descripción completa

Detalles Bibliográficos
Autores principales: Ma, Boyang, Chen, Shupeng, Wang, Shulong, Qian, Lingli, Han, Zeen, Huang, Wei, Fu, Xiaojun, Liu, Hongxia
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10300732/
https://www.ncbi.nlm.nih.gov/pubmed/37374758
http://dx.doi.org/10.3390/mi14061172
_version_ 1785064645966430208
author Ma, Boyang
Chen, Shupeng
Wang, Shulong
Qian, Lingli
Han, Zeen
Huang, Wei
Fu, Xiaojun
Liu, Hongxia
author_facet Ma, Boyang
Chen, Shupeng
Wang, Shulong
Qian, Lingli
Han, Zeen
Huang, Wei
Fu, Xiaojun
Liu, Hongxia
author_sort Ma, Boyang
collection PubMed
description A power clamp circuit, which has good immunity to false trigger under fast power-on conditions with a 20 ns rising edge, is proposed in this paper. The proposed circuit has a separate detection component and an on-time control component which enable it to distinguish between electrostatic discharge (ESD) events and fast power-on events. As opposed to other on-time control techniques, instead of large resistors or capacitors, which can cause a large occupation of the layout area, we use a capacitive voltage-biased p-channel MOSFET in the on-time control part of the proposed circuit. The capacitive voltage-biased p-channel MOSFET is in the saturation region after the ESD event is detected, which can serve as a large equivalent resistance (~10(6) Ω) in the structure. The proposed power clamp circuit offers several advantages compared to the traditional circuit, such as having at least 70% area savings in the trigger circuit area (30% area savings in the whole circuit area), supporting a power supply ramp time as fast as 20 ns, dissipating the ESD energy more cleanly with little residual charge, and recovering faster from false triggers. The rail clamp circuit also offers robust performance in an industry-standard PVT (process, voltage, and temperature) space and has been verified by the simulation results. Showing good performance of human body model (HBM) endurance and high immunity to false trigger, the proposed power clamp circuit has great potential for application in ESD protection.
format Online
Article
Text
id pubmed-10300732
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-103007322023-06-29 A False Trigger-Strengthened and Area-Saving Power-Rail Clamp Circuit with High ESD Performance Ma, Boyang Chen, Shupeng Wang, Shulong Qian, Lingli Han, Zeen Huang, Wei Fu, Xiaojun Liu, Hongxia Micromachines (Basel) Article A power clamp circuit, which has good immunity to false trigger under fast power-on conditions with a 20 ns rising edge, is proposed in this paper. The proposed circuit has a separate detection component and an on-time control component which enable it to distinguish between electrostatic discharge (ESD) events and fast power-on events. As opposed to other on-time control techniques, instead of large resistors or capacitors, which can cause a large occupation of the layout area, we use a capacitive voltage-biased p-channel MOSFET in the on-time control part of the proposed circuit. The capacitive voltage-biased p-channel MOSFET is in the saturation region after the ESD event is detected, which can serve as a large equivalent resistance (~10(6) Ω) in the structure. The proposed power clamp circuit offers several advantages compared to the traditional circuit, such as having at least 70% area savings in the trigger circuit area (30% area savings in the whole circuit area), supporting a power supply ramp time as fast as 20 ns, dissipating the ESD energy more cleanly with little residual charge, and recovering faster from false triggers. The rail clamp circuit also offers robust performance in an industry-standard PVT (process, voltage, and temperature) space and has been verified by the simulation results. Showing good performance of human body model (HBM) endurance and high immunity to false trigger, the proposed power clamp circuit has great potential for application in ESD protection. MDPI 2023-05-31 /pmc/articles/PMC10300732/ /pubmed/37374758 http://dx.doi.org/10.3390/mi14061172 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Ma, Boyang
Chen, Shupeng
Wang, Shulong
Qian, Lingli
Han, Zeen
Huang, Wei
Fu, Xiaojun
Liu, Hongxia
A False Trigger-Strengthened and Area-Saving Power-Rail Clamp Circuit with High ESD Performance
title A False Trigger-Strengthened and Area-Saving Power-Rail Clamp Circuit with High ESD Performance
title_full A False Trigger-Strengthened and Area-Saving Power-Rail Clamp Circuit with High ESD Performance
title_fullStr A False Trigger-Strengthened and Area-Saving Power-Rail Clamp Circuit with High ESD Performance
title_full_unstemmed A False Trigger-Strengthened and Area-Saving Power-Rail Clamp Circuit with High ESD Performance
title_short A False Trigger-Strengthened and Area-Saving Power-Rail Clamp Circuit with High ESD Performance
title_sort false trigger-strengthened and area-saving power-rail clamp circuit with high esd performance
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10300732/
https://www.ncbi.nlm.nih.gov/pubmed/37374758
http://dx.doi.org/10.3390/mi14061172
work_keys_str_mv AT maboyang afalsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT chenshupeng afalsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT wangshulong afalsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT qianlingli afalsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT hanzeen afalsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT huangwei afalsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT fuxiaojun afalsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT liuhongxia afalsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT maboyang falsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT chenshupeng falsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT wangshulong falsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT qianlingli falsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT hanzeen falsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT huangwei falsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT fuxiaojun falsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance
AT liuhongxia falsetriggerstrengthenedandareasavingpowerrailclampcircuitwithhighesdperformance