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Multiple Electronic Phases Coexisting under Inhomogeneous Strains in the Correlated Insulator

Monolayer transition metal dichalcogenides (TMDs) can host exotic phenomena such as correlated insulating and charge‐density‐wave (CDW) phases. Such properties are strongly dependent on the precise atomic arrangements. Strain, as an effective tuning parameter in atomic arrangements, has been widely...

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Autores principales: Hou, Baofei, Zhang, Yu, Zhang, Teng, Wu, Jizheng, Zhang, Quanzhen, Han, Xu, Huang, Zeping, Chen, Yaoyao, Ji, Hongyan, Wang, Tingting, Liu, Liwei, Si, Chen, Gao, Hong‐Jun, Wang, Yeliang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10323623/
https://www.ncbi.nlm.nih.gov/pubmed/37097711
http://dx.doi.org/10.1002/advs.202300789
_version_ 1785068988257009664
author Hou, Baofei
Zhang, Yu
Zhang, Teng
Wu, Jizheng
Zhang, Quanzhen
Han, Xu
Huang, Zeping
Chen, Yaoyao
Ji, Hongyan
Wang, Tingting
Liu, Liwei
Si, Chen
Gao, Hong‐Jun
Wang, Yeliang
author_facet Hou, Baofei
Zhang, Yu
Zhang, Teng
Wu, Jizheng
Zhang, Quanzhen
Han, Xu
Huang, Zeping
Chen, Yaoyao
Ji, Hongyan
Wang, Tingting
Liu, Liwei
Si, Chen
Gao, Hong‐Jun
Wang, Yeliang
author_sort Hou, Baofei
collection PubMed
description Monolayer transition metal dichalcogenides (TMDs) can host exotic phenomena such as correlated insulating and charge‐density‐wave (CDW) phases. Such properties are strongly dependent on the precise atomic arrangements. Strain, as an effective tuning parameter in atomic arrangements, has been widely used for tailoring material's structures and related properties, yet to date, a convincing demonstration of strain‐induced dedicate phase transition at nanometer scale in monolayer TMDs has been lacking. Here, a strain engineering technique is developed to controllably introduce out‐of‐plane atomic deformations in monolayer CDW material 1T‐NbSe(2). The scanning tunneling microscopy and spectroscopy (STM and STS) measurements, accompanied by first‐principles calculations, demonstrate that the CDW phase of 1T‐NbSe(2) can survive under both tensile and compressive strains even up to 5%. Moreover, significant strain‐induced phase transitions are observed, i.e., tensile (compressive) strains can drive 1T‐NbSe(2) from an intrinsic‐correlated insulator into a band insulator (metal). Furthermore, experimental evidence of the multiple electronic phase coexistence at the nanoscale is provided. The results shed new lights on the strain engineering of correlated insulator and useful for design and development of strain‐related nanodevices.
format Online
Article
Text
id pubmed-10323623
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher John Wiley and Sons Inc.
record_format MEDLINE/PubMed
spelling pubmed-103236232023-07-07 Multiple Electronic Phases Coexisting under Inhomogeneous Strains in the Correlated Insulator Hou, Baofei Zhang, Yu Zhang, Teng Wu, Jizheng Zhang, Quanzhen Han, Xu Huang, Zeping Chen, Yaoyao Ji, Hongyan Wang, Tingting Liu, Liwei Si, Chen Gao, Hong‐Jun Wang, Yeliang Adv Sci (Weinh) Research Articles Monolayer transition metal dichalcogenides (TMDs) can host exotic phenomena such as correlated insulating and charge‐density‐wave (CDW) phases. Such properties are strongly dependent on the precise atomic arrangements. Strain, as an effective tuning parameter in atomic arrangements, has been widely used for tailoring material's structures and related properties, yet to date, a convincing demonstration of strain‐induced dedicate phase transition at nanometer scale in monolayer TMDs has been lacking. Here, a strain engineering technique is developed to controllably introduce out‐of‐plane atomic deformations in monolayer CDW material 1T‐NbSe(2). The scanning tunneling microscopy and spectroscopy (STM and STS) measurements, accompanied by first‐principles calculations, demonstrate that the CDW phase of 1T‐NbSe(2) can survive under both tensile and compressive strains even up to 5%. Moreover, significant strain‐induced phase transitions are observed, i.e., tensile (compressive) strains can drive 1T‐NbSe(2) from an intrinsic‐correlated insulator into a band insulator (metal). Furthermore, experimental evidence of the multiple electronic phase coexistence at the nanoscale is provided. The results shed new lights on the strain engineering of correlated insulator and useful for design and development of strain‐related nanodevices. John Wiley and Sons Inc. 2023-04-25 /pmc/articles/PMC10323623/ /pubmed/37097711 http://dx.doi.org/10.1002/advs.202300789 Text en © 2023 The Authors. Advanced Science published by Wiley‐VCH GmbH https://creativecommons.org/licenses/by/4.0/This is an open access article under the terms of the http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
spellingShingle Research Articles
Hou, Baofei
Zhang, Yu
Zhang, Teng
Wu, Jizheng
Zhang, Quanzhen
Han, Xu
Huang, Zeping
Chen, Yaoyao
Ji, Hongyan
Wang, Tingting
Liu, Liwei
Si, Chen
Gao, Hong‐Jun
Wang, Yeliang
Multiple Electronic Phases Coexisting under Inhomogeneous Strains in the Correlated Insulator
title Multiple Electronic Phases Coexisting under Inhomogeneous Strains in the Correlated Insulator
title_full Multiple Electronic Phases Coexisting under Inhomogeneous Strains in the Correlated Insulator
title_fullStr Multiple Electronic Phases Coexisting under Inhomogeneous Strains in the Correlated Insulator
title_full_unstemmed Multiple Electronic Phases Coexisting under Inhomogeneous Strains in the Correlated Insulator
title_short Multiple Electronic Phases Coexisting under Inhomogeneous Strains in the Correlated Insulator
title_sort multiple electronic phases coexisting under inhomogeneous strains in the correlated insulator
topic Research Articles
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10323623/
https://www.ncbi.nlm.nih.gov/pubmed/37097711
http://dx.doi.org/10.1002/advs.202300789
work_keys_str_mv AT houbaofei multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT zhangyu multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT zhangteng multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT wujizheng multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT zhangquanzhen multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT hanxu multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT huangzeping multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT chenyaoyao multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT jihongyan multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT wangtingting multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT liuliwei multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT sichen multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT gaohongjun multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator
AT wangyeliang multipleelectronicphasescoexistingunderinhomogeneousstrainsinthecorrelatedinsulator