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On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup

The size of the smallest detectable sample feature in an x-ray imaging system is usually restricted by the spatial resolution of the system. This limitation can now be overcome using the diffusive dark-field signal, which is generated by unresolved phase effects or the ultra-small-angle x-ray scatte...

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Autores principales: How, Ying Ying, Paganin, David M., Morgan, Kaye S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10329004/
https://www.ncbi.nlm.nih.gov/pubmed/37419926
http://dx.doi.org/10.1038/s41598-023-37334-3
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author How, Ying Ying
Paganin, David M.
Morgan, Kaye S.
author_facet How, Ying Ying
Paganin, David M.
Morgan, Kaye S.
author_sort How, Ying Ying
collection PubMed
description The size of the smallest detectable sample feature in an x-ray imaging system is usually restricted by the spatial resolution of the system. This limitation can now be overcome using the diffusive dark-field signal, which is generated by unresolved phase effects or the ultra-small-angle x-ray scattering from unresolved sample microstructures. A quantitative measure of this dark-field signal can be useful in revealing the microstructure size or material for medical diagnosis, security screening and materials science. Recently, we derived a new method to quantify the diffusive dark-field signal in terms of a scattering angle using a single-exposure grid-based approach. In this manuscript, we look at the problem of quantifying the sample microstructure size from this single-exposure dark-field signal. We do this by quantifying the diffusive dark-field signal produced by 5 different sizes of polystyrene microspheres, ranging from 1.0 to 10.8 µm, to investigate how the strength of the extracted dark-field signal changes with the sample microstructure size, [Formula: see text] . We also explore the feasibility of performing single-exposure dark-field imaging with a simple equation for the optimal propagation distance, given microstructure with a specific size and thickness, and show consistency between this model and experimental data. Our theoretical model predicts that the dark-field scattering angle is inversely proportional to [Formula: see text] , which is also consistent with our experimental data.
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spelling pubmed-103290042023-07-09 On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup How, Ying Ying Paganin, David M. Morgan, Kaye S. Sci Rep Article The size of the smallest detectable sample feature in an x-ray imaging system is usually restricted by the spatial resolution of the system. This limitation can now be overcome using the diffusive dark-field signal, which is generated by unresolved phase effects or the ultra-small-angle x-ray scattering from unresolved sample microstructures. A quantitative measure of this dark-field signal can be useful in revealing the microstructure size or material for medical diagnosis, security screening and materials science. Recently, we derived a new method to quantify the diffusive dark-field signal in terms of a scattering angle using a single-exposure grid-based approach. In this manuscript, we look at the problem of quantifying the sample microstructure size from this single-exposure dark-field signal. We do this by quantifying the diffusive dark-field signal produced by 5 different sizes of polystyrene microspheres, ranging from 1.0 to 10.8 µm, to investigate how the strength of the extracted dark-field signal changes with the sample microstructure size, [Formula: see text] . We also explore the feasibility of performing single-exposure dark-field imaging with a simple equation for the optimal propagation distance, given microstructure with a specific size and thickness, and show consistency between this model and experimental data. Our theoretical model predicts that the dark-field scattering angle is inversely proportional to [Formula: see text] , which is also consistent with our experimental data. Nature Publishing Group UK 2023-07-07 /pmc/articles/PMC10329004/ /pubmed/37419926 http://dx.doi.org/10.1038/s41598-023-37334-3 Text en © The Author(s) 2023 https://creativecommons.org/licenses/by/4.0/Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
How, Ying Ying
Paganin, David M.
Morgan, Kaye S.
On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup
title On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup
title_full On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup
title_fullStr On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup
title_full_unstemmed On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup
title_short On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup
title_sort on the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10329004/
https://www.ncbi.nlm.nih.gov/pubmed/37419926
http://dx.doi.org/10.1038/s41598-023-37334-3
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