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On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup
The size of the smallest detectable sample feature in an x-ray imaging system is usually restricted by the spatial resolution of the system. This limitation can now be overcome using the diffusive dark-field signal, which is generated by unresolved phase effects or the ultra-small-angle x-ray scatte...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10329004/ https://www.ncbi.nlm.nih.gov/pubmed/37419926 http://dx.doi.org/10.1038/s41598-023-37334-3 |