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FEM-GAN: A Physics-Supervised Deep Learning Generative Model for Elastic Porous Materials
X-ray [Formula: see text] CT imaging is a common technique that is used to gain access to the full-field characterization of materials. Nevertheless, the process can be expensive and time-consuming, thus limiting image availability. A number of existing generative models can assist in mitigating th...
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10342502/ https://www.ncbi.nlm.nih.gov/pubmed/37445054 http://dx.doi.org/10.3390/ma16134740 |
Sumario: | X-ray [Formula: see text] CT imaging is a common technique that is used to gain access to the full-field characterization of materials. Nevertheless, the process can be expensive and time-consuming, thus limiting image availability. A number of existing generative models can assist in mitigating this limitation, but they often lack a sound physical basis. This work presents a physics-supervised generative adversarial networks (GANs) model and applies it to the generation of X-ray [Formula: see text] CT images. FEM simulations provide physical information in the form of elastic coefficients. Negative X-ray [Formula: see text] CT images of a Hostun sand were used as the target material. During training, image batches were evaluated with nonparametric statistics to provide posterior metrics. A variety of loss functions and FEM evaluation frequencies were tested in a parametric study. The results show, that in several test scenarios, FEM-GANs-generated images proved to be better than the reference images for most of the elasticity coefficients. Although the model failed at perfectly reproducing the three out-of-axis coefficients in most cases, the model showed a net improvement with respect to the GANs reference. The generated images can be used in data augmentation, the calibration of image analysis tools, filling incomplete X-ray [Formula: see text] CT images, and generating microscale variability in multiscale applications. |
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