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Ag(e)ing and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures

The most prominent and highly visible advantage attributed to supercapacitors of any type and application, beyond their most notable feature of high current capability, is their high stability in terms of lifetime, number of possible charge/discharge cycles or other stability-related properties. Unf...

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Detalles Bibliográficos
Autores principales: Chen, Xuecheng, Wu, Yuping, Holze, Rudolf
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10343366/
https://www.ncbi.nlm.nih.gov/pubmed/37446693
http://dx.doi.org/10.3390/molecules28135028
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author Chen, Xuecheng
Wu, Yuping
Holze, Rudolf
author_facet Chen, Xuecheng
Wu, Yuping
Holze, Rudolf
author_sort Chen, Xuecheng
collection PubMed
description The most prominent and highly visible advantage attributed to supercapacitors of any type and application, beyond their most notable feature of high current capability, is their high stability in terms of lifetime, number of possible charge/discharge cycles or other stability-related properties. Unfortunately, actual devices show more or less pronounced deterioration of performance parameters during time and use. Causes for this in the material and component levels, as well as on the device level, have only been addressed and discussed infrequently in published reports. The present review attempts a complete coverage on these levels; it adds in modelling approaches and provides suggestions for slowing down ag(e)ing and degradation.
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spelling pubmed-103433662023-07-14 Ag(e)ing and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures Chen, Xuecheng Wu, Yuping Holze, Rudolf Molecules Review The most prominent and highly visible advantage attributed to supercapacitors of any type and application, beyond their most notable feature of high current capability, is their high stability in terms of lifetime, number of possible charge/discharge cycles or other stability-related properties. Unfortunately, actual devices show more or less pronounced deterioration of performance parameters during time and use. Causes for this in the material and component levels, as well as on the device level, have only been addressed and discussed infrequently in published reports. The present review attempts a complete coverage on these levels; it adds in modelling approaches and provides suggestions for slowing down ag(e)ing and degradation. MDPI 2023-06-27 /pmc/articles/PMC10343366/ /pubmed/37446693 http://dx.doi.org/10.3390/molecules28135028 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Review
Chen, Xuecheng
Wu, Yuping
Holze, Rudolf
Ag(e)ing and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures
title Ag(e)ing and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures
title_full Ag(e)ing and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures
title_fullStr Ag(e)ing and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures
title_full_unstemmed Ag(e)ing and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures
title_short Ag(e)ing and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures
title_sort ag(e)ing and degradation of supercapacitors: causes, mechanisms, models and countermeasures
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10343366/
https://www.ncbi.nlm.nih.gov/pubmed/37446693
http://dx.doi.org/10.3390/molecules28135028
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