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A Novel Density of States (DOS) for Disordered Organic Semiconductors

In this work, we proposed a novel theory of DOS for disordered organic semiconductors based on the frontier orbital theory and probability statistics. The proposed DOS has been verified by comparing with other DOS alternatives and experimental data, and the mobility calculated by the proposed DOS is...

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Detalles Bibliográficos
Autores principales: Qin, Dong, Chen, Jiezhi, Lu, Nianduan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10383803/
https://www.ncbi.nlm.nih.gov/pubmed/37512673
http://dx.doi.org/10.3390/mi14071361
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author Qin, Dong
Chen, Jiezhi
Lu, Nianduan
author_facet Qin, Dong
Chen, Jiezhi
Lu, Nianduan
author_sort Qin, Dong
collection PubMed
description In this work, we proposed a novel theory of DOS for disordered organic semiconductors based on the frontier orbital theory and probability statistics. The proposed DOS has been verified by comparing with other DOS alternatives and experimental data, and the mobility calculated by the proposed DOS is closer to experimental data than traditional DOS. Moreover, we also provide a detailed method to choose the DOS parameter for better use of the proposed DOS. This paper also contains a prediction for the DOS parameters, and it has been verified by the experimental data. More importantly, the physical meaning of the proposed DOS parameter has been explained by equilibrium energy theory and transport energy theory to make this proposed model more rational. Compared with the improved DOS based on Gaussian and exponential DOS, this work is a new attempt to combine probabilistic theory with physical theory related to DOS in disordered organic semiconductors, showing great significance for the further investigation of the properties of DOS.
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spelling pubmed-103838032023-07-30 A Novel Density of States (DOS) for Disordered Organic Semiconductors Qin, Dong Chen, Jiezhi Lu, Nianduan Micromachines (Basel) Article In this work, we proposed a novel theory of DOS for disordered organic semiconductors based on the frontier orbital theory and probability statistics. The proposed DOS has been verified by comparing with other DOS alternatives and experimental data, and the mobility calculated by the proposed DOS is closer to experimental data than traditional DOS. Moreover, we also provide a detailed method to choose the DOS parameter for better use of the proposed DOS. This paper also contains a prediction for the DOS parameters, and it has been verified by the experimental data. More importantly, the physical meaning of the proposed DOS parameter has been explained by equilibrium energy theory and transport energy theory to make this proposed model more rational. Compared with the improved DOS based on Gaussian and exponential DOS, this work is a new attempt to combine probabilistic theory with physical theory related to DOS in disordered organic semiconductors, showing great significance for the further investigation of the properties of DOS. MDPI 2023-06-30 /pmc/articles/PMC10383803/ /pubmed/37512673 http://dx.doi.org/10.3390/mi14071361 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Qin, Dong
Chen, Jiezhi
Lu, Nianduan
A Novel Density of States (DOS) for Disordered Organic Semiconductors
title A Novel Density of States (DOS) for Disordered Organic Semiconductors
title_full A Novel Density of States (DOS) for Disordered Organic Semiconductors
title_fullStr A Novel Density of States (DOS) for Disordered Organic Semiconductors
title_full_unstemmed A Novel Density of States (DOS) for Disordered Organic Semiconductors
title_short A Novel Density of States (DOS) for Disordered Organic Semiconductors
title_sort novel density of states (dos) for disordered organic semiconductors
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10383803/
https://www.ncbi.nlm.nih.gov/pubmed/37512673
http://dx.doi.org/10.3390/mi14071361
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