Linear Antenna Array Sectorized Beam Scanning Approaches Using Element Position Perturbation in the Azimuth Plane

In this paper, two sector beam scanning approaches (BSAs) based on element position perturbations (EPPs) in the azimuth plane are introduced. In EPP-BSA, the elements’ excitations are kept constant and the elements’ positions in the direction normal to the array line are changed according to a predetermined EPP pattern. The magnitude and repetition rate of the selected EPP pattern determines the steering angle of the main beam. However, EPP-BSA results in a wide scanning range with a significant increase in the side lobe level (SLL). To mitigate this drawback, a reduction in the SLL of the array pattern is firstly performed using the single convolution/genetic algorithm (SC/GA) technique and then perturbing the elements’ positions in the azimuth plane. This combination between SLL reduction and EPP-BSA (SLL/EPP-BSA) results in a smaller scanning range with a relatively constant half power beamwidth (HPBW) and a much lower SLL. In addition, keeping the synthesized excitation coefficients constant without adding progressive phase shifters facilitates the manufacturing process and reduces the cost of the feeding network. Furthermore, a planar antenna array thinning approach is proposed to realize the EPP-BSA. The results are realized using the computer simulation technology (CST) microwave studio software package, which provides users with an optimized modeling environment and results in realizable and realistic designs.