Mid-Level Data Fusion Combined with the Fingerprint Region for Classification DON Levels Defect of Fusarium Head Blight Wheat

In this study, a method of mid-level data fusion with the fingerprint region was proposed, which was combined with the characteristic wavelengths that contain fingerprint information in NIR and FT-MIR spectra to detect the DON level in FHB wheat during wheat processing. NIR and FT-MIR raw spectrosco...

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Detalles Bibliográficos
Autores principales: Liang, Kun, Song, Jinpeng, Yuan, Rui, Ren, Zhizhou
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10384187/
https://www.ncbi.nlm.nih.gov/pubmed/37514894
http://dx.doi.org/10.3390/s23146600

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10384187/
https://www.ncbi.nlm.nih.gov/pubmed/37514894
http://dx.doi.org/10.3390/s23146600

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