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Surfactant incorporated preyssler polyoxoanion: a transition metal substituted Mo-PHP complex and its applications
The complex was prepared with preyssler polyoxoanion and transition metal (Mo), a cationic surfactant as a connector. It has tuneable physical and chemical potential which has been exploited to study novel properties. A new technique of shock wave impulses is also used on the Mo-PHP complex. Extensi...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Scientific and Technological Research Council of Turkey (TUBITAK)
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10387894/ https://www.ncbi.nlm.nih.gov/pubmed/37528927 http://dx.doi.org/10.55730/1300-0527.3543 |
Sumario: | The complex was prepared with preyssler polyoxoanion and transition metal (Mo), a cationic surfactant as a connector. It has tuneable physical and chemical potential which has been exploited to study novel properties. A new technique of shock wave impulses is also used on the Mo-PHP complex. Extensive use of cationic surfactants could impact accumulation in the environment set off the surfacing of bacterial resistance. Due to the electrostatic binding to bacterial surface, the hydrophobic parts of cationic surfactants tend to penetrate bacterial cell walls and may cause membrane lysis and bacteria death. The surfactant-supported and direct release of metal ions from P(5)W(29)Mo against bacterial resistance has been explained schematically. The dielectric study helps to understand the dissociation of cations that generate polarons and the hopping mechanism with neighbouring vacant atomic sites. Structural analysis confirms the formation of cationic surfactant incorporated polyoxoanion (Mo-PHP). A hexagonal shape-like structure for the PHP complex has been observed. The Mo-incorporated PHP complex was characterized using UV-visible (UV), Fourier Transform-infrared (IR), Raman spectra, scanning electron microscope (SEM), energy dispersive spectroscopy (EDS), and X-ray diffraction (XRD) techniques. |
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