Segmentation and counting of wheat spike grains based on deep learning and textural feature

BACKGROUND: Grain count is crucial to wheat yield composition and estimating yield parameters. However, traditional manual counting methods are time-consuming and labor-intensive. This study developed an advanced deep learning technique for the segmentation counting model of wheat grains. This model has been rigorously tested on three distinct wheat varieties: ‘Bainong 307’, ‘Xinmai 26’, and ‘Jimai 336’, and it has achieved unprecedented predictive counting accuracy. METHOD: The images of wheat ears were taken with a smartphone at the late stage of wheat grain filling. We used image processing technology to preprocess and normalize the images to 480*480 pixels. A CBAM-HRNet wheat grain segmentation counting deep learning model based on the Convolutional Block Attention Module (CBAM) was constructed by combining deep learning, migration learning, and attention mechanism. Image processing algorithms and wheat grain texture features were used to build a grain counting and predictive counting model for wheat grains. RESULTS: The CBAM-HRNet model using the CBAM was the best for wheat grain segmentation. Its segmentation accuracy of 92.04%, the mean Intersection over Union (mIoU) of 85.21%, the category mean pixel accuracy (mPA) of 91.16%, and the recall rate of 91.16% demonstrate superior robustness compared to other models such as HRNet, PSPNet, DeeplabV3+ , and U-Net. Method I for spike count, which calculates twice the number of grains on one side of the spike to determine the total number of grains, demonstrates a coefficient of determination R(2) of 0.85, a mean absolute error (MAE) of 1.53, and a mean relative error (MRE) of 2.91. In contrast, Method II for spike count involves summing the number of grains on both sides to determine the total number of grains, demonstrating a coefficient of determination R(2) of 0.92, an MAE) of 1.15, and an MRE) of 2.09%. CONCLUSIONS: Image segmentation algorithm of the CBAM-HRNet wheat spike grain is a powerful solution that uses the CBAM to segment wheat spike grains and obtain richer semantic information. This model can effectively address the challenges of small target image segmentation and under-fitting problems in training. Additionally, the spike grain counting model can quickly and accurately predict the grain count of wheat, providing algorithmic support for efficient and intelligent wheat yield estimation.