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Fabrication of p-type 2D single-crystalline transistor arrays with Fermi-level-tuned van der Waals semimetal electrodes

High-performance p-type two-dimensional (2D) transistors are fundamental for 2D nanoelectronics. However, the lack of a reliable method for creating high-quality, large-scale p-type 2D semiconductors and a suitable metallization process represents important challenges that need to be addressed for f...

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Detalles Bibliográficos
Autores principales: Song, Seunguk, Yoon, Aram, Jang, Sora, Lynch, Jason, Yang, Jihoon, Han, Juwon, Choe, Myeonggi, Jin, Young Ho, Chen, Cindy Yueli, Cheon, Yeryun, Kwak, Jinsung, Jeong, Changwook, Cheong, Hyeonsik, Jariwala, Deep, Lee, Zonghoon, Kwon, Soon-Yong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10406929/
https://www.ncbi.nlm.nih.gov/pubmed/37550303
http://dx.doi.org/10.1038/s41467-023-40448-x
Descripción
Sumario:High-performance p-type two-dimensional (2D) transistors are fundamental for 2D nanoelectronics. However, the lack of a reliable method for creating high-quality, large-scale p-type 2D semiconductors and a suitable metallization process represents important challenges that need to be addressed for future developments of the field. Here, we report the fabrication of scalable p-type 2D single-crystalline 2H-MoTe(2) transistor arrays with Fermi-level-tuned 1T’-phase semimetal contact electrodes. By transforming polycrystalline 1T’-MoTe(2) to 2H polymorph via abnormal grain growth, we fabricated 4-inch 2H-MoTe(2) wafers with ultra-large single-crystalline domains and spatially-controlled single-crystalline arrays at a low temperature (~500 °C). Furthermore, we demonstrate on-chip transistors by lithographic patterning and layer-by-layer integration of 1T’ semimetals and 2H semiconductors. Work function modulation of 1T’-MoTe(2) electrodes was achieved by depositing 3D metal (Au) pads, resulting in minimal contact resistance (~0.7 kΩ·μm) and near-zero Schottky barrier height (~14 meV) of the junction interface, and leading to high on-state current (~7.8 μA/μm) and on/off current ratio (~10(5)) in the 2H-MoTe(2) transistors.