Revealing low-loss dielectric near-field modes of hexagonal boron nitride by photoemission electron microscopy

Low-loss dielectric modes are important features and functional bases of fundamental optical components in on-chip optical devices. However, dielectric near-field modes are challenging to reveal with high spatiotemporal resolution and fast direct imaging. Herein, we present a method to address this...

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Detalles Bibliográficos
Autores principales: Li, Yaolong, Jiang, Pengzuo, Lyu, Xiaying, Li, Xiaofang, Qi, Huixin, Tang, Jinglin, Xue, Zhaohang, Yang, Hong, Lu, Guowei, Sun, Quan, Hu, Xiaoyong, Gao, Yunan, Gong, Qihuang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10415285/
https://www.ncbi.nlm.nih.gov/pubmed/37563183
http://dx.doi.org/10.1038/s41467-023-40603-4

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