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Effects of Wire Electrical Discharge Finishing Cuts on the Surface Integrity of Additively Manufactured Ti6Al4V Alloy
The Selective laser melting (SLM) technology of recent years allows for building complex-shaped parts with difficult-to-cut materials such as Ti6Al4V alloy. Nevertheless, the surface integrity after SLM is characterized by surface roughness and defects in the microstructure. The use of additional fi...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10420315/ https://www.ncbi.nlm.nih.gov/pubmed/37570179 http://dx.doi.org/10.3390/ma16155476 |
Sumario: | The Selective laser melting (SLM) technology of recent years allows for building complex-shaped parts with difficult-to-cut materials such as Ti6Al4V alloy. Nevertheless, the surface integrity after SLM is characterized by surface roughness and defects in the microstructure. The use of additional finishing technology, such as machining, laser polishing, or mechanical polishing, is used to achieve desired surface properties. In this study, improving SLM Ti6Al4V alloy surface integrity using wire electrical discharge machining (WEDM) is proposed. The influence of finishing WEDM cuts and the discharge energy on the surface roughness parameters Sa, Svk, Spk, and Sk and the composition of the recast layer were investigated. The proposed finishing technology allows for significant improvement of the surface roughness by up to 88% (from Sa = 6.74 µm to Sa = 0.8 µm). Furthermore, the SEM analyses of surface morphology indicate improving surface integrity properties by removing the balling effect, unmelted particles, and the presence of microcracks. EDS analysis of the recast layer indicated a significant influence of discharge energy and the polarization of the electrode on its composition and thickness. Depending on the used discharge energy and the number of finishing cuts, changes in the composition of the material in the range of 2 to 10 µm were observed. |
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