Assessing the Quality of Oxygen Plasma Focused Ion Beam (O-PFIB) Etching on Polypropylene Surfaces Using Secondary Electron Hyperspectral Imaging

The development of Focused Ion Beam–Scanning Electron Microscopy (FIB-SEM) systems has provided significant advances in the processing and characterization of polymers. A fundamental understanding of ion–sample interactions is still missing despite FIB-SEM being routinely applied in microstructural...

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Detalles Bibliográficos
Autores principales: Farr, Nicholas T. H., Pasniewski, Maciej, de Marco, Alex
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10422415/
https://www.ncbi.nlm.nih.gov/pubmed/37571142
http://dx.doi.org/10.3390/polym15153247

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