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A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology

This paper presents a wideband 4-bit true time delay IC using a 0.25 μm GaN HEMT (High-Electron-Mobility Transistor) process for the beam-squint-free phased array antennas. The true time delay IC is implemented with a switched path circuit topology using DPDT (Double Pole Double Throw) with no shunt...

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Detalles Bibliográficos
Autores principales: Kim, Jeong-Geun, Baek, Donghyun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10422639/
https://www.ncbi.nlm.nih.gov/pubmed/37571609
http://dx.doi.org/10.3390/s23156827
_version_ 1785089260948291584
author Kim, Jeong-Geun
Baek, Donghyun
author_facet Kim, Jeong-Geun
Baek, Donghyun
author_sort Kim, Jeong-Geun
collection PubMed
description This paper presents a wideband 4-bit true time delay IC using a 0.25 μm GaN HEMT (High-Electron-Mobility Transistor) process for the beam-squint-free phased array antennas. The true time delay IC is implemented with a switched path circuit topology using DPDT (Double Pole Double Throw) with no shunt transistor in the inter-stages to improve the bandwidth and SPDT (Single Pole Single Throw) switches at the input and the output ports. The delay lines are implemented with CLC π-networks with the lumped element to ensure a compact chip size. A negative voltage generator and an SPI controller are implemented in the PCB (Printed Circuit Board) due to the lack of digital control logic in GaN technology. A maximum time delay of ~182 ps with a time delay resolution of 10.5 ps is achieved at DC–6 GHz. The RMS (Root Mean Square) time delay and amplitude error are <5 ps and <0.6 dB, respectively. The measured insertion loss is <6.8 dB and the input and output return losses are >10 dB at DC–6 GHz. The current consumption is nearly zero with a 3.3 V supply. The chip size including pads is 2.45 × 1.75 mm(2). To the authors’ knowledge, this is the first demonstration of a true time delay IC using GaN HEMT technology.
format Online
Article
Text
id pubmed-10422639
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-104226392023-08-13 A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology Kim, Jeong-Geun Baek, Donghyun Sensors (Basel) Communication This paper presents a wideband 4-bit true time delay IC using a 0.25 μm GaN HEMT (High-Electron-Mobility Transistor) process for the beam-squint-free phased array antennas. The true time delay IC is implemented with a switched path circuit topology using DPDT (Double Pole Double Throw) with no shunt transistor in the inter-stages to improve the bandwidth and SPDT (Single Pole Single Throw) switches at the input and the output ports. The delay lines are implemented with CLC π-networks with the lumped element to ensure a compact chip size. A negative voltage generator and an SPI controller are implemented in the PCB (Printed Circuit Board) due to the lack of digital control logic in GaN technology. A maximum time delay of ~182 ps with a time delay resolution of 10.5 ps is achieved at DC–6 GHz. The RMS (Root Mean Square) time delay and amplitude error are <5 ps and <0.6 dB, respectively. The measured insertion loss is <6.8 dB and the input and output return losses are >10 dB at DC–6 GHz. The current consumption is nearly zero with a 3.3 V supply. The chip size including pads is 2.45 × 1.75 mm(2). To the authors’ knowledge, this is the first demonstration of a true time delay IC using GaN HEMT technology. MDPI 2023-07-31 /pmc/articles/PMC10422639/ /pubmed/37571609 http://dx.doi.org/10.3390/s23156827 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Communication
Kim, Jeong-Geun
Baek, Donghyun
A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology
title A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology
title_full A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology
title_fullStr A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology
title_full_unstemmed A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology
title_short A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology
title_sort wideband true time delay circuit using 0.25 µm gan hemt technology
topic Communication
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10422639/
https://www.ncbi.nlm.nih.gov/pubmed/37571609
http://dx.doi.org/10.3390/s23156827
work_keys_str_mv AT kimjeonggeun awidebandtruetimedelaycircuitusing025μmganhemttechnology
AT baekdonghyun awidebandtruetimedelaycircuitusing025μmganhemttechnology
AT kimjeonggeun widebandtruetimedelaycircuitusing025μmganhemttechnology
AT baekdonghyun widebandtruetimedelaycircuitusing025μmganhemttechnology