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A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology
This paper presents a wideband 4-bit true time delay IC using a 0.25 μm GaN HEMT (High-Electron-Mobility Transistor) process for the beam-squint-free phased array antennas. The true time delay IC is implemented with a switched path circuit topology using DPDT (Double Pole Double Throw) with no shunt...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10422639/ https://www.ncbi.nlm.nih.gov/pubmed/37571609 http://dx.doi.org/10.3390/s23156827 |
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author | Kim, Jeong-Geun Baek, Donghyun |
author_facet | Kim, Jeong-Geun Baek, Donghyun |
author_sort | Kim, Jeong-Geun |
collection | PubMed |
description | This paper presents a wideband 4-bit true time delay IC using a 0.25 μm GaN HEMT (High-Electron-Mobility Transistor) process for the beam-squint-free phased array antennas. The true time delay IC is implemented with a switched path circuit topology using DPDT (Double Pole Double Throw) with no shunt transistor in the inter-stages to improve the bandwidth and SPDT (Single Pole Single Throw) switches at the input and the output ports. The delay lines are implemented with CLC π-networks with the lumped element to ensure a compact chip size. A negative voltage generator and an SPI controller are implemented in the PCB (Printed Circuit Board) due to the lack of digital control logic in GaN technology. A maximum time delay of ~182 ps with a time delay resolution of 10.5 ps is achieved at DC–6 GHz. The RMS (Root Mean Square) time delay and amplitude error are <5 ps and <0.6 dB, respectively. The measured insertion loss is <6.8 dB and the input and output return losses are >10 dB at DC–6 GHz. The current consumption is nearly zero with a 3.3 V supply. The chip size including pads is 2.45 × 1.75 mm(2). To the authors’ knowledge, this is the first demonstration of a true time delay IC using GaN HEMT technology. |
format | Online Article Text |
id | pubmed-10422639 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-104226392023-08-13 A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology Kim, Jeong-Geun Baek, Donghyun Sensors (Basel) Communication This paper presents a wideband 4-bit true time delay IC using a 0.25 μm GaN HEMT (High-Electron-Mobility Transistor) process for the beam-squint-free phased array antennas. The true time delay IC is implemented with a switched path circuit topology using DPDT (Double Pole Double Throw) with no shunt transistor in the inter-stages to improve the bandwidth and SPDT (Single Pole Single Throw) switches at the input and the output ports. The delay lines are implemented with CLC π-networks with the lumped element to ensure a compact chip size. A negative voltage generator and an SPI controller are implemented in the PCB (Printed Circuit Board) due to the lack of digital control logic in GaN technology. A maximum time delay of ~182 ps with a time delay resolution of 10.5 ps is achieved at DC–6 GHz. The RMS (Root Mean Square) time delay and amplitude error are <5 ps and <0.6 dB, respectively. The measured insertion loss is <6.8 dB and the input and output return losses are >10 dB at DC–6 GHz. The current consumption is nearly zero with a 3.3 V supply. The chip size including pads is 2.45 × 1.75 mm(2). To the authors’ knowledge, this is the first demonstration of a true time delay IC using GaN HEMT technology. MDPI 2023-07-31 /pmc/articles/PMC10422639/ /pubmed/37571609 http://dx.doi.org/10.3390/s23156827 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Communication Kim, Jeong-Geun Baek, Donghyun A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology |
title | A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology |
title_full | A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology |
title_fullStr | A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology |
title_full_unstemmed | A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology |
title_short | A Wideband True Time Delay Circuit Using 0.25 µm GaN HEMT Technology |
title_sort | wideband true time delay circuit using 0.25 µm gan hemt technology |
topic | Communication |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10422639/ https://www.ncbi.nlm.nih.gov/pubmed/37571609 http://dx.doi.org/10.3390/s23156827 |
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