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Copper Wire Bonding: A Review
This paper provides a comprehensive review on copper (Cu) wire bonding. Firstly, it introduces the common types of Cu wire available in the market, including bare Cu wire, coated Cu wire, insulated Cu wire, and alloyed Cu wire. For each type, their characteristics and application areas are discussed...
Autores principales: | , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10456435/ https://www.ncbi.nlm.nih.gov/pubmed/37630148 http://dx.doi.org/10.3390/mi14081612 |
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author | Zhou, Hongliang Chang, Andong Fan, Junling Cao, Jun An, Bin Xia, Jie Yao, Jingguang Cui, Xiaobin Zhang, Yingchong |
author_facet | Zhou, Hongliang Chang, Andong Fan, Junling Cao, Jun An, Bin Xia, Jie Yao, Jingguang Cui, Xiaobin Zhang, Yingchong |
author_sort | Zhou, Hongliang |
collection | PubMed |
description | This paper provides a comprehensive review on copper (Cu) wire bonding. Firstly, it introduces the common types of Cu wire available in the market, including bare Cu wire, coated Cu wire, insulated Cu wire, and alloyed Cu wire. For each type, their characteristics and application areas are discussed. Additionally, we provide detailed insights into the impact of Free Air Ball (FAB) morphology on bonding reliability, including its effect on bond strength and formation mechanisms. Next, the reliability of Cu wire bonding is analyzed, with a focus on the impact of intermetallic compounds and corrosion on bonding reliability. Specifically, the formation, growth, and stability of intermetallic compounds at bonding interfaces are discussed, and their effects on bonding strength and reliability are evaluated. The detrimental mechanisms of corrosion on Cu wire bonding and corrosion inhibition methods are also analyzed. Subsequently, the applications of simulation in Cu wire bonding are presented, including finite element analysis and molecular dynamics simulations, which provide important tools for a deeper understanding of the bonding process and failure mechanisms. Finally, the current development status of Cu wire bonding is summarized, and future research directions are discussed. |
format | Online Article Text |
id | pubmed-10456435 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-104564352023-08-26 Copper Wire Bonding: A Review Zhou, Hongliang Chang, Andong Fan, Junling Cao, Jun An, Bin Xia, Jie Yao, Jingguang Cui, Xiaobin Zhang, Yingchong Micromachines (Basel) Review This paper provides a comprehensive review on copper (Cu) wire bonding. Firstly, it introduces the common types of Cu wire available in the market, including bare Cu wire, coated Cu wire, insulated Cu wire, and alloyed Cu wire. For each type, their characteristics and application areas are discussed. Additionally, we provide detailed insights into the impact of Free Air Ball (FAB) morphology on bonding reliability, including its effect on bond strength and formation mechanisms. Next, the reliability of Cu wire bonding is analyzed, with a focus on the impact of intermetallic compounds and corrosion on bonding reliability. Specifically, the formation, growth, and stability of intermetallic compounds at bonding interfaces are discussed, and their effects on bonding strength and reliability are evaluated. The detrimental mechanisms of corrosion on Cu wire bonding and corrosion inhibition methods are also analyzed. Subsequently, the applications of simulation in Cu wire bonding are presented, including finite element analysis and molecular dynamics simulations, which provide important tools for a deeper understanding of the bonding process and failure mechanisms. Finally, the current development status of Cu wire bonding is summarized, and future research directions are discussed. MDPI 2023-08-16 /pmc/articles/PMC10456435/ /pubmed/37630148 http://dx.doi.org/10.3390/mi14081612 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Review Zhou, Hongliang Chang, Andong Fan, Junling Cao, Jun An, Bin Xia, Jie Yao, Jingguang Cui, Xiaobin Zhang, Yingchong Copper Wire Bonding: A Review |
title | Copper Wire Bonding: A Review |
title_full | Copper Wire Bonding: A Review |
title_fullStr | Copper Wire Bonding: A Review |
title_full_unstemmed | Copper Wire Bonding: A Review |
title_short | Copper Wire Bonding: A Review |
title_sort | copper wire bonding: a review |
topic | Review |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10456435/ https://www.ncbi.nlm.nih.gov/pubmed/37630148 http://dx.doi.org/10.3390/mi14081612 |
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